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dc.contributor.authorTalantsev, E. F.en
dc.date.accessioned2020-09-29T09:47:54Z-
dc.date.available2020-09-29T09:47:54Z-
dc.date.issued2019-
dc.identifier.citationTalantsev, E. F. Dc self-field critical current in superconductor dirac-cone material/superconductor junctions / E. F. Talantsev. — DOI 10.3390/nano9111554 // Nanomaterials. — 2019. — Vol. 11. — Iss. 9. — 1554.en
dc.identifier.issn2079-4991-
dc.identifier.otherhttps://www.mdpi.com/2079-4991/9/11/1554/pdfpdf
dc.identifier.other1good_DOI
dc.identifier.otheraf73b1fb-1a8d-4ea7-8923-effe240f56ffpure_uuid
dc.identifier.otherhttp://www.scopus.com/inward/record.url?partnerID=8YFLogxK&scp=85075001111m
dc.identifier.urihttp://elar.urfu.ru/handle/10995/90569-
dc.description.abstractRecently, several research groups have reported on anomalous enhancement of the self-field critical currents, Ic(sf,T), at low temperatures in superconductor/Dirac-cone material/superconductor (S/DCM/S) junctions. Some papers attributed the enhancement to the low-energy Andreev bound states arising from winding of the electronic wave function around DCM. In this paper, Ic(sf,T) in S/DCM/S junctions have been analyzed by two approaches: Modified Ambegaokar-Baratoff and ballistic Titov-Beenakker models. It is shown that the ballistic model is an inadequate tool to analyze experimental data from S/DCM/S junctions. The primary mechanism for limiting superconducting current in S/DCM/S junctions is different from the conventional view that the latter is the maximum value within the order parameter phase variation. Thus, there is a need to develop a new model for self-field critical currents in S/DCM/S systems. © 2019 by the authors. Licensee MDPI, Basel, Switzerland.en
dc.description.sponsorship02.A03.21.0006en
dc.description.sponsorshipAAAA-A18-118020190104-3en
dc.description.sponsorshipFunding: This research was funded by the State Assignment of Minobrnauki of Russia, theme “Pressure” No. AAAA-A18-118020190104-3, and by Act 211 Government of the Russian Federation, contract No. 02.A03.21.0006.en
dc.format.mimetypeapplication/pdfen
dc.language.isoenen
dc.publisherMDPI AGen
dc.rightsinfo:eu-repo/semantics/openAccessen
dc.rightscc-byother
dc.sourceNanomaterialsen
dc.subjectINDUCED SUPERCONDUCTIVITY IN DIRAC-CONE MATERIALSen
dc.subjectMULTIPLE-BAND SUPERCONDUCTIVITYen
dc.subjectSINGLE LAYER GRAPHENEen
dc.subjectTHE SELF-FIELD CRITICAL CURRENTen
dc.titleDc self-field critical current in superconductor dirac-cone material/superconductor junctionsen
dc.typeArticleen
dc.typeinfo:eu-repo/semantics/articleen
dc.typeinfo:eu-repo/semantics/publishedVersionen
dc.identifier.doi10.3390/nano9111554-
dc.identifier.scopus85075001111-
local.affiliationM. N. Mikheev Institute of Metal Physics, Ural Branch, Russian Academy of Sciences, 18, S. Kovalevskoy St., Ekaterinburg, 620108, Russian Federationen
local.affiliationNANOTECH Centre, Ural Federal University, 19 Mira St., Ekaterinburg, 620002, Russian Federationen
local.contributor.employeeTalantsev, E.F., M. N. Mikheev Institute of Metal Physics, Ural Branch, Russian Academy of Sciences, 18, S. Kovalevskoy St., Ekaterinburg, 620108, Russian Federation, NANOTECH Centre, Ural Federal University, 19 Mira St., Ekaterinburg, 620002, Russian Federationru
local.issue9-
local.volume11-
dc.identifier.wos000502271700049-
local.identifier.pure11331972-
local.description.order1554-
local.identifier.eid2-s2.0-85075001111-
local.identifier.wosWOS:000502271700049-
Располагается в коллекциях:Научные публикации ученых УрФУ, проиндексированные в SCOPUS и WoS CC

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