Please use this identifier to cite or link to this item: https://elar.urfu.ru/handle/10995/80798
Title: Local study of the domain wall mobility in ferroelectric ceramics under the action of electric field and mechanical loading
Authors: Abramov, A. S.
Alikin, D. O.
Turygin, A. P.
Neradovskiy, M. M.
Kornilova, V. S.
Nikitin, A. V.
Karpinsky, D. V.
Shur, V. Ya.
Kholkin, A. L.
Шур, В. Я.
Issue Date: 2018
Publisher: Ural Federal University
Citation: Local study of the domain wall mobility in ferroelectric ceramics under the action of electric field and mechanical loading / A. S. Abramov, D. O. Alikin, A. P. Turygin, M. M. Neradovskiy, V. S. Kornilova, A. V. Nikitin, D. V. Karpinsky, V. Ya. Shur, A. L. Kholkin // Scanning Probe Microscopy. Abstract Book of International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2018. — p. 84.
URI: http://elar.urfu.ru/handle/10995/80798
Conference name: International Conference "Scanning Probe Microscopy" ; International Workshop "Modern Nanotechnologies" ; International Youth Conference "Functional Imaging of Nanomaterials"
Conference date: 26.08.2018-29.08.2018
ISBN: 978-5-9500624-1-4
Sponsorship: The equipment of the Ural Center for Shared Use “Modern nanotechnology” was used. The reported study was funded by RFBR (grant No. 17-52-04074) and BRFFR (grant No. F17RM-036). This work was developed within the scope of the project CICECO-Aveiro Institute of Materials, POCI-01-0145-FEDER-007679 (FCT Ref. UID/CTM/50011/2013), financed by national funds through the FCT/MEC and when appropriate co-financed by FEDER under the PT2020 Partnership Agreement. This project has received funding from the European Union’s Horizon 2020 research and innovation program under the Marie Skłodowska-Curie grant agreement No 778070.
Origin: International Conference "Scanning Probe Microscopy" ; International Workshop "Modern Nanotechnologies" ; International Youth Conference "Functional Imaging of Nanomaterials". — Ekaterinburg, 2018
Appears in Collections:Scanning Probe Microscopy

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