Please use this identifier to cite or link to this item: http://elar.urfu.ru/handle/10995/80785
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dc.contributor.authorAkhmatkhanov, A. R.en
dc.contributor.authorVaskina, E. M.en
dc.contributor.authorChuvakova, M. A.en
dc.contributor.authorPelegova, E. V.en
dc.contributor.authorEsin, A. A.en
dc.contributor.authorGachegova, E.en
dc.contributor.authorKolker, D. B.en
dc.contributor.authorShur, V. Ya.en
dc.contributor.authorШур, В. Я.ru
dc.date.accessioned2020-03-24T06:59:41Z-
dc.date.available2020-03-24T06:59:41Z-
dc.date.issued2018-
dc.identifier.citationPolarization reversal in KTP single crystals with surface dielectric layer and at elevated temperatures / A. R. Akhmatkhanov, E. M. Vaskina, M. A. Chuvakova, E. V. Pelegova, A. A. Esin, E. Gachegova, D. B. Kolker, V. Ya. Shur // Scanning Probe Microscopy. Abstract Book of International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2018. — p. 69.en
dc.identifier.isbn978-5-9500624-1-4-
dc.identifier.urihttp://elar.urfu.ru/handle/10995/80785-
dc.description.sponsorshipThe research was made possible in part by Government of the Russian Federation (Act 211, Agreement 02.A03.21.0006) by RFBR (grant 16-02-00724), and by President of Russian Federation grant for young scientists (Contract 14.Y30.17.2837-MK). The equipment of the Ural Center for Shared Use “Modern nanotechnology” Ural Federal University was used.en
dc.format.mimetypeapplication/pdfen
dc.language.isoenen
dc.publisherUral Federal Universityen
dc.relation.ispartofInternational Conference "Scanning Probe Microscopy" ; International Workshop "Modern Nanotechnologies" ; International Youth Conference "Functional Imaging of Nanomaterials". — Ekaterinburg, 2018en
dc.titlePolarization reversal in KTP single crystals with surface dielectric layer and at elevated temperaturesen
dc.typeConference Paperen
dc.typeinfo:eu-repo/semantics/conferenceObjecten
dc.typeinfo:eu-repo/semantics/publishedVersionen
dc.conference.nameInternational Conference "Scanning Probe Microscopy" ; International Workshop "Modern Nanotechnologies" ; International Youth Conference "Functional Imaging of Nanomaterials"en
dc.conference.date26.08.2018-29.08.2018-
local.description.firstpage69-
local.description.lastpage69-
local.description.orderO-26-
Appears in Collections:Scanning Probe Microscopy

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