1. Электронный научный архив УрФУ
  2. 00. Общеуниверситетские коллекции
  3. Конференции, семинары, сборники
  4. Scanning Probe Microscopy
Please use this identifier to cite or link to this item: https://elar.urfu.ru/handle/10995/80723
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dc.contributor.authorShcherbakova, O. O.en
dc.contributor.authorMuravyeva, T. I.en
dc.contributor.authorBobrov, Yu. A.en
dc.contributor.authorZagorskiy, D. L.en
dc.contributor.authorShkaley, I. V.en
dc.date.accessioned2020-03-24T06:59:27Z-
dc.date.available2020-03-24T06:59:27Z-
dc.date.issued2018-
dc.identifier.citationProbe microscopy in the study of the surface of aluminum alloys / O. O. Shcherbakova, T. I. Muravyeva, Yu. A. Bobrov, D. L. Zagorskiy, I. V. Shkaley // Scanning Probe Microscopy. Abstract Book of International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2018. — p. 200-201.en
dc.identifier.isbn978-5-9500624-1-4-
dc.identifier.urihttp://elar.urfu.ru/handle/10995/80723-
dc.description.sponsorshipThe work was supported by the Grant of the RNF 14-19-01033-P (study of topography and elemental composition of the surface) and the State Task (№ State registration AAAA-A17-117021310379-5 - study of electrical properties of the surface). The authors are grateful to N.A. Belov (MISiS) for providing samples.en
dc.format.mimetypeapplication/pdfen
dc.language.isoenen
dc.publisherUral Federal Universityen
dc.relationinfo:eu-repo/grantAgreement/RSF//14-19-01033-Pen
dc.relation.ispartofInternational Conference "Scanning Probe Microscopy" ; International Workshop "Modern Nanotechnologies" ; International Youth Conference "Functional Imaging of Nanomaterials". — Ekaterinburg, 2018en
dc.titleProbe microscopy in the study of the surface of aluminum alloysen
dc.typeConference Paperen
dc.typeinfo:eu-repo/semantics/conferenceObjecten
dc.typeinfo:eu-repo/semantics/publishedVersionen
dc.conference.nameInternational Conference "Scanning Probe Microscopy" ; International Workshop "Modern Nanotechnologies" ; International Youth Conference "Functional Imaging of Nanomaterials"en
dc.conference.date26.08.2018-29.08.2018-
local.description.firstpage200-
local.description.lastpage201-
local.description.orderP-84-
Appears in Collections:Scanning Probe Microscopy

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