Please use this identifier to cite or link to this item: http://hdl.handle.net/10995/80674
Title: Scanning probe methods for studying surface structures - history of development and recent possibilities
Authors: Bykov, V. A.
Issue Date: 2018
Publisher: Ural Federal University
Citation: Bykov V. A. Scanning probe methods for studying surface structures - history of development and recent possibilities / V. A. Bykov // Scanning Probe Microscopy. Abstract Book of International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2018. — p. 5-6.
URI: http://hdl.handle.net/10995/80674
Conference name: International Conference "Scanning Probe Microscopy" ; International Workshop "Modern Nanotechnologies" ; International Youth Conference "Functional Imaging of Nanomaterials"
Conference date: 26.08.2018-29.08.2018
ISBN: 978-5-9500624-1-4
Origin: International Conference "Scanning Probe Microscopy" ; International Workshop "Modern Nanotechnologies" ; International Youth Conference "Functional Imaging of Nanomaterials". — Ekaterinburg, 2018
Appears in Collections:Scanning Probe Microscopy

Files in This Item:
File Description SizeFormat 
978-5-9500624-1-4_2018_001.pdf237,97 kBAdobe PDFView/Open


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.