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https://elar.urfu.ru/handle/10995/79239Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Neradovskaia, E. A. | en |
| dc.contributor.author | Neradovskiy, M. M. | en |
| dc.contributor.author | Chuvakova, M. A. | en |
| dc.contributor.author | Akhmatkhanov, A. R. | en |
| dc.contributor.author | Baldi, P. | en |
| dc.contributor.author | Maksimenka, R. | en |
| dc.contributor.author | Forget, N. | en |
| dc.contributor.author | Shur, V. Ya. | en |
| dc.contributor.author | Шур, В. Я. | ru |
| dc.date.accessioned | 2019-12-19T12:26:28Z | - |
| dc.date.available | 2019-12-19T12:26:28Z | - |
| dc.date.issued | 2019 | - |
| dc.identifier.citation | Periodical poling in congruent lithium niobate with slanted polar axis / E. A. Neradovskaia, M. M. Neradovskiy, M. A. Chuvakova, A. R. Akhmatkhanov, P. Baldi, R. Maksimenka, N. Forget, V. Ya. Shur // Scanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. Abstract Book of Joint International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2019. — P. 113-114. | en |
| dc.identifier.isbn | 978-5-9500624-2-1 | - |
| dc.identifier.uri | http://elar.urfu.ru/handle/10995/79239 | - |
| dc.description.sponsorship | The equipment of the Ural Center for Shared Use “Modern Nanotechnology” Ural Federal University was used. EN is grateful for the financial support of Fastlite Ltd. through the convention n0163967 with CNRS. | en |
| dc.format.mimetype | application/pdf | en |
| dc.language.iso | en | en |
| dc.publisher | Ural Federal University | en |
| dc.relation.ispartof | Scanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. — Ekaterinburg, 2019 | en |
| dc.title | Periodical poling in congruent lithium niobate with slanted polar axis | en |
| dc.type | Conference Paper | en |
| dc.type | info:eu-repo/semantics/conferenceObject | en |
| dc.type | info:eu-repo/semantics/publishedVersion | en |
| dc.conference.name | 3rd International Conference "Scanning Probe Microscopy" ; 4th Russia-China Workshop on Dielectric and Ferroelectric Materials ; International Youth Conference "Functional Imaging of nanomaterials" | en |
| dc.conference.date | 25.08.2019-28.08.2019 | - |
| local.description.firstpage | 113 | - |
| local.description.lastpage | 114 | - |
| Appears in Collections: | Scanning Probe Microscopy | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 978-5-9500624-2-1_2019_093.pdf | 377,76 kB | Adobe PDF | View/Open |
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