1. Электронный научный архив УрФУ
  2. 00. Общеуниверситетские коллекции
  3. Конференции, семинары, сборники
  4. Scanning Probe Microscopy
Please use this identifier to cite or link to this item: http://elar.urfu.ru/handle/10995/79217
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dc.contributor.authorZhuang, J.en
dc.contributor.authorBokov, A. A.en
dc.contributor.authorZhang, N.en
dc.contributor.authorZhang, J.en
dc.contributor.authorRen, W.en
dc.contributor.authorYe, Z. -G.en
dc.date.accessioned2019-12-19T12:26:26Z-
dc.date.available2019-12-19T12:26:26Z-
dc.date.issued2019-
dc.identifier.citationChemically engineered multiferroic Morphotropic Phase Boundary in BiFeO3-based single phase multiferroics / J. Zhuang, A. A. Bokov, N. Zhang, J. Zhang, W. Ren, Z. -G. Ye // Scanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. Abstract Book of Joint International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2019. — P. 88.en
dc.identifier.isbn978-5-9500624-2-1-
dc.identifier.urihttp://elar.urfu.ru/handle/10995/79217-
dc.format.mimetypeapplication/pdfen
dc.language.isoenen
dc.publisherUral Federal Universityen
dc.relation.ispartofScanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. — Ekaterinburg, 2019en
dc.titleChemically engineered multiferroic Morphotropic Phase Boundary in BiFeO3-based single phase multiferroicsen
dc.typeConference Paperen
dc.typeinfo:eu-repo/semantics/conferenceObjecten
dc.typeinfo:eu-repo/semantics/publishedVersionen
dc.conference.name3rd International Conference "Scanning Probe Microscopy" ; 4th Russia-China Workshop on Dielectric and Ferroelectric Materials ; International Youth Conference "Functional Imaging of nanomaterials"en
dc.conference.date25.08.2019-28.08.2019-
local.description.firstpage88-
local.description.lastpage88-
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