Please use this identifier to cite or link to this item: http://hdl.handle.net/10995/79211
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dc.contributor.authorHe, C.en
dc.contributor.authorXiong, J.en
dc.contributor.authorLong, X.en
dc.date.accessioned2019-12-19T12:26:25Z-
dc.date.available2019-12-19T12:26:25Z-
dc.date.issued2019-
dc.identifier.citationHe C. Domain engineering in relaxor-PT ferroelectric single crystals / C. He, J. Xiong, X. Long // Scanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. Abstract Book of Joint International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2019. — P. 83.en
dc.identifier.isbn978-5-9500624-2-1-
dc.identifier.urihttp://hdl.handle.net/10995/79211-
dc.format.mimetypeapplication/pdfen
dc.language.isoenen
dc.publisherUral Federal Universityen
dc.relation.ispartofScanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. — Ekaterinburg, 2019en
dc.titleDomain engineering in relaxor-PT ferroelectric single crystalsen
dc.typeConference Paperen
dc.typeinfo:eu-repo/semantics/conferenceObjecten
dc.typeinfo:eu-repo/semantics/publishedVersionen
dc.conference.name3rd International Conference "Scanning Probe Microscopy" ; 4th Russia-China Workshop on Dielectric and Ferroelectric Materials ; International Youth Conference "Functional Imaging of nanomaterials"en
dc.conference.date25.08.2019-28.08.2019-
local.description.firstpage83-
local.description.lastpage83-
Appears in Collections:Scanning Probe Microscopy

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