The investigation of the time characteristic of local polar inhomogeneities in paraelectric phase in relaxors and ferroelectric crystals: on the example of SrxBa1-xNb2O6 crystals with different chemical composition

Zaytseva, I. V.; Pugachev, A. M.

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Поле DC	Значение	Язык
dc.contributor.author	Zaytseva, I. V.	en
dc.contributor.author	Pugachev, A. M.	en
dc.date.accessioned	2019-12-19T12:26:24Z	-
dc.date.available	2019-12-19T12:26:24Z	-
dc.date.issued	2019	-
dc.identifier.citation	Zaytseva I. V. The investigation of the time characteristic of local polar inhomogeneities in paraelectric phase in relaxors and ferroelectric crystals: on the example of SrxBa1-xNb2O6 crystals with different chemical composition / I. V. Zaytseva, A. M. Pugachev // Scanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. Abstract Book of Joint International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2019. — P. 79.	en
dc.identifier.isbn	978-5-9500624-2-1	-
dc.identifier.uri	http://elar.urfu.ru/handle/10995/79207	-
dc.description.sponsorship	The reported study was funded by RFBR according to the research projects No. 18-02-00399 and State assignment No AAAAA17-117052410033-9. The experiments were performed in the multiple-access center “High-Resolution Spectroscopy of Gases and Condensed Matter” in IA&E SBRAS (Novosibirsk, Russia).	en
dc.format.mimetype	application/pdf	en
dc.language.iso	en	en
dc.publisher	Ural Federal University	en
dc.relation.ispartof	Scanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. — Ekaterinburg, 2019	en
dc.title	The investigation of the time characteristic of local polar inhomogeneities in paraelectric phase in relaxors and ferroelectric crystals: on the example of SrxBa1-xNb2O6 crystals with different chemical composition	en
dc.type	Conference Paper	en
dc.type	info:eu-repo/semantics/conferenceObject	en
dc.type	info:eu-repo/semantics/publishedVersion	en
dc.conference.name	3rd International Conference "Scanning Probe Microscopy" ; 4th Russia-China Workshop on Dielectric and Ferroelectric Materials ; International Youth Conference "Functional Imaging of nanomaterials"	en
dc.conference.date	25.08.2019-28.08.2019	-
local.description.firstpage	79	-
local.description.lastpage	79	-
Располагается в коллекциях:	Scanning Probe Microscopy

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