Please use this identifier to cite or link to this item: http://hdl.handle.net/10995/79191
Title: Infrared imaging: fundamentals and applications
Authors: Tofail, S. A. M.
O’Mahony, C.
Markham, S.
Mani, A.
Silien, C.
Bauer, J.
Korsakova, E.
Korsakov, A.
Zhukova, L.
Issue Date: 2019
Publisher: Ural Federal University
Citation: Infrared imaging: fundamentals and applications / S. A. M. Tofail, C. O’Mahony, S. Markham, A. Mani, C. Silien, J. Bauer, E. Korsakova, A. Korsakov, L. Zhukova // Scanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. Abstract Book of Joint International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2019. — P. 9.
URI: http://hdl.handle.net/10995/79191
Conference name: 3rd International Conference "Scanning Probe Microscopy" ; 4th Russia-China Workshop on Dielectric and Ferroelectric Materials ; International Youth Conference "Functional Imaging of nanomaterials"
Conference date: 25.08.2019-28.08.2019
ISBN: 978-5-9500624-2-1
Origin: Scanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. — Ekaterinburg, 2019
Appears in Collections:Scanning Probe Microscopy

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