ISSN: 2310-757X
Please use this identifier to cite or link to this item:
https://elar.urfu.ru/handle/10995/79166| Title: | Atomic force microscopy of layer-doped triglycine sulfate ferroelectric crystals |
| Authors: | Gainutdinov, R. V. Tolstikhina, A. L. Lashkova, A. K. Roshchin, B. S. Zolotov, D. A. Asadchikov, V. E. Shut, V. N. Kashevich, I. F. Mozzharov, S. E. |
| Issue Date: | 2019 |
| Publisher: | Ural Federal University |
| Citation: | Atomic force microscopy of layer-doped triglycine sulfate ferroelectric crystals / R. V. Gainutdinov, A. L. Tolstikhina, A. K. Lashkova, B. S. Roshchin, D. A. Zolotov, V. E. Asadchikov, V. N. Shut, I. F. Kashevich, S. E. Mozzharov // Scanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. Abstract Book of Joint International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2019. — P. 35-36. |
| URI: | http://elar.urfu.ru/handle/10995/79166 |
| Conference name: | 3rd International Conference "Scanning Probe Microscopy" ; 4th Russia-China Workshop on Dielectric and Ferroelectric Materials ; International Youth Conference "Functional Imaging of nanomaterials" |
| Conference date: | 25.08.2019-28.08.2019 |
| ISBN: | 978-5-9500624-2-1 |
| Sponsorship: | This work was supported by the Ministry of Science and Higher Education within the State assignment FSRC «Crystallography and Photonics» RAS. |
| Origin: | Scanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. — Ekaterinburg, 2019 |
| Appears in Collections: | Scanning Probe Microscopy |
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|---|---|---|---|---|
| 978-5-9500624-2-1_2019_027.pdf | 718,27 kB | Adobe PDF | View/Open |
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