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Полная запись метаданных
Поле DC | Значение | Язык |
---|---|---|
dc.contributor.author | Vasilev, S. | en |
dc.contributor.author | Vasileva, D. | en |
dc.contributor.author | Luneva, O. | en |
dc.contributor.author | Vodyakshin, A. | en |
dc.contributor.author | Chezganov, D. | en |
dc.contributor.author | Yuzhakov, V. | en |
dc.contributor.author | Shur, V. Ya. | en |
dc.contributor.author | Skorb, E. | en |
dc.contributor.author | Vinogradov, A. | en |
dc.contributor.author | Шур, В. Я. | ru |
dc.date.accessioned | 2019-12-19T12:26:17Z | - |
dc.date.available | 2019-12-19T12:26:17Z | - |
dc.date.issued | 2019 | - |
dc.identifier.citation | Semi-contact AFM for surface characterisation in case of holographic PDADMAC films and functionalised paper / S. Vasilev, D. Vasileva, O. Luneva, A. Vodyakshin, D. Chezganov, V. Yuzhakov, V. Ya. Shur, E. Skorb, A. Vinogradov // Scanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. Abstract Book of Joint International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2019. — P. 280. | en |
dc.identifier.isbn | 978-5-9500624-2-1 | - |
dc.identifier.uri | http://elar.urfu.ru/handle/10995/79146 | - |
dc.description.sponsorship | The research was carried out using equipment of the Ural Center for Shared Use "Modern Nanotechnologies" Ural Federal University. A. Vinogradov acknowledges the scholarship of the President of the Russian Federation (SP-1158.2019.1): S. Vasilev acknowledges the mobility programs of the Institute of Natural Sciences and Mathematics for the Young scientists in the 2018 year. | en |
dc.format.mimetype | application/pdf | en |
dc.language.iso | en | en |
dc.publisher | Ural Federal University | en |
dc.relation.ispartof | Scanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. — Ekaterinburg, 2019 | en |
dc.title | Semi-contact AFM for surface characterisation in case of holographic PDADMAC films and functionalised paper | en |
dc.type | Conference Paper | en |
dc.type | info:eu-repo/semantics/conferenceObject | en |
dc.type | info:eu-repo/semantics/publishedVersion | en |
dc.conference.name | 3rd International Conference "Scanning Probe Microscopy" ; 4th Russia-China Workshop on Dielectric and Ferroelectric Materials ; International Youth Conference "Functional Imaging of nanomaterials" | en |
dc.conference.date | 25.08.2019-28.08.2019 | - |
local.description.firstpage | 280 | - |
local.description.lastpage | 280 | - |
Располагается в коллекциях: | Scanning Probe Microscopy |
Файлы этого ресурса:
Файл | Описание | Размер | Формат | |
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978-5-9500624-2-1_2019_225.pdf | 245,62 kB | Adobe PDF | Просмотреть/Открыть |
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