ISSN: 2310-757X
Please use this identifier to cite or link to this item:
http://hdl.handle.net/10995/79131| Title: | Local polarization reversal in relaxor SBN single crystals by electron and ion beam irradiation |
| Authors: | Shikhova, V. A. Fedorovykh, V. V. Chezganov, D. S. Vlasov, E. O. Zelenovskiy, P. S. Greshnyakov, E. D. Nebogatikov, M. S. Anikin, V. A. Kholkin, A. L. Ivleva, L. V. Shur, V. Ya. Шур, В. Я. |
| Issue Date: | 2019 |
| Publisher: | Ural Federal University |
| Citation: | Local polarization reversal in relaxor SBN single crystals by electron and ion beam irradiation / V. A. Shikhova, V. V. Fedorovykh, D. S. Chezganov, E. O. Vlasov, P. S. Zelenovskiy, E. D. Greshnyakov, M. S. Nebogatikov, V. A. Anikin, A. L. Kholkin, L. V. Ivleva, V. Ya. Shur // Scanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. Abstract Book of Joint International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2019. — P. 261. |
| URI: | http://hdl.handle.net/10995/79131 |
| Conference name: | 3rd International Conference "Scanning Probe Microscopy" ; 4th Russia-China Workshop on Dielectric and Ferroelectric Materials ; International Youth Conference "Functional Imaging of nanomaterials" |
| Conference date: | 25.08.2019-28.08.2019 |
| ISBN: | 978-5-9500624-2-1 |
| metadata.dc.description.sponsorship: | The equipment of the Ural Center for Shared Use “Modern Nanotechnology” UrFU was used. The research was made possible by the Russian Science Foundation (grant № 19-72-00008). |
| RSCF project card: | 19-72-00008 |
| Origin: | Scanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. — Ekaterinburg, 2019 |
| Appears in Collections: | Scanning Probe Microscopy |
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| File | Description | Size | Format | |
|---|---|---|---|---|
| 978-5-9500624-2-1_2019_211.pdf | 158,67 kB | Adobe PDF | View/Open |
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