1. Электронный научный архив УрФУ
  2. 00. Общеуниверситетские коллекции
  3. Конференции, семинары, сборники
  4. Scanning Probe Microscopy
Please use this identifier to cite or link to this item: http://elar.urfu.ru/handle/10995/79119
Full metadata record
DC FieldValueLanguage
dc.contributor.authorSavchenkov, Е. N.en
dc.contributor.authorShandarov, S. М.en
dc.contributor.authorSmirnov, S. V.en
dc.contributor.authorEsin, А. A.en
dc.contributor.authorAkhmatkhanov, A. R.en
dc.contributor.authorShur, V. Ya.en
dc.contributor.authorШур, В. Я.ru
dc.date.accessioned2019-12-19T12:26:14Z-
dc.date.available2019-12-19T12:26:14Z-
dc.date.issued2019-
dc.identifier.citationDiffraction methods of investigation of the periodical domain structures with inclined domain walls in lithium niobate / Е. N. Savchenkov, S. М. Shandarov, S. V. Smirnov, А. A. Esin, A. R. Akhmatkhanov, V. Ya. Shur // Scanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. Abstract Book of Joint International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2019. — P. 245-246.en
dc.identifier.isbn978-5-9500624-2-1-
dc.identifier.urihttp://elar.urfu.ru/handle/10995/79119-
dc.description.sponsorshipThis work was supported by the Russian Foundation for Basic Research (Grant No 16-29-14046-ofi_m) and by the Ministry of Science and Higher Education of the Russian Federation for 2017- 2019 (State Tasks No 3.1110.2017/4.6 and 3.8898.2017/8.9).en
dc.format.mimetypeapplication/pdfen
dc.language.isoenen
dc.publisherUral Federal Universityen
dc.relation.ispartofScanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. — Ekaterinburg, 2019en
dc.titleDiffraction methods of investigation of the periodical domain structures with inclined domain walls in lithium niobateen
dc.typeConference Paperen
dc.typeinfo:eu-repo/semantics/conferenceObjecten
dc.typeinfo:eu-repo/semantics/publishedVersionen
dc.conference.name3rd International Conference "Scanning Probe Microscopy" ; 4th Russia-China Workshop on Dielectric and Ferroelectric Materials ; International Youth Conference "Functional Imaging of nanomaterials"en
dc.conference.date25.08.2019-28.08.2019-
local.description.firstpage245-
local.description.lastpage246-
Appears in Collections:Scanning Probe Microscopy

Files in This Item:
File Description SizeFormat 
978-5-9500624-2-1_2019_200.pdf273,36 kBAdobe PDFView/Open
Show simple item record   Google Scholar





Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.