1. Электронный научный архив УрФУ
  2. 00. Общеуниверситетские коллекции
  3. Конференции, семинары, сборники
  4. Scanning Probe Microscopy
Please use this identifier to cite or link to this item: http://elar.urfu.ru/handle/10995/79098
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dc.contributor.authorPiskunov, O. S.en
dc.contributor.authorMaksimova, O. G.en
dc.contributor.authorEgorov, V. I.en
dc.contributor.authorGerasimov, R. A.en
dc.contributor.authorBaruzdina, O. S.en
dc.contributor.authorMaksimov, A. V.en
dc.date.accessioned2019-12-19T12:26:11Z-
dc.date.available2019-12-19T12:26:11Z-
dc.date.issued2019-
dc.identifier.citationComputer modeling of shear strain in the polymer brushes / O. S. Piskunov, O. G. Maksimova, V. I. Egorov, R. A. Gerasimov, O. S. Baruzdina, A. V. Maksimov // Scanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. Abstract Book of Joint International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2019. — P. 225.en
dc.identifier.isbn978-5-9500624-2-1-
dc.identifier.urihttp://elar.urfu.ru/handle/10995/79098-
dc.description.sponsorshipR.A.G. acknowledge the financial support by the Russian Science Foundation under grant “Methods of microstructural nonlinear analysis, wave dynamics and mechanics of composites for research and design of modern metamaterials and elements of structures made on its base” (No 15-19- 10008).en
dc.format.mimetypeapplication/pdfen
dc.language.isoenen
dc.publisherUral Federal Universityen
dc.relationinfo:eu-repo/grantAgreement/RSF//15-19-10008en
dc.relation.ispartofScanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. — Ekaterinburg, 2019en
dc.titleComputer modeling of shear strain in the polymer brushesen
dc.typeConference Paperen
dc.typeinfo:eu-repo/semantics/conferenceObjecten
dc.typeinfo:eu-repo/semantics/publishedVersionen
dc.conference.name3rd International Conference "Scanning Probe Microscopy" ; 4th Russia-China Workshop on Dielectric and Ferroelectric Materials ; International Youth Conference "Functional Imaging of nanomaterials"en
dc.conference.date25.08.2019-28.08.2019-
local.description.firstpage225-
local.description.lastpage225-
local.fund.rsf15-19-10008-
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