Please use this identifier to cite or link to this item: http://hdl.handle.net/10995/79090
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dc.contributor.authorPanov, D. V.en
dc.contributor.authorCherkasov, D. A.en
dc.contributor.authorZagorskiy, D. L.en
dc.date.accessioned2019-12-19T12:26:10Z-
dc.date.available2019-12-19T12:26:10Z-
dc.date.issued2019-
dc.identifier.citationPanov D. V. Probe microscopy for investigation of conical nanowires / D. V. Panov, D. A. Cherkasov, D. L. Zagorskiy // Scanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. Abstract Book of Joint International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2019. — P. 218.en
dc.identifier.isbn978-5-9500624-2-1-
dc.identifier.urihttp://hdl.handle.net/10995/79090-
dc.format.mimetypeapplication/pdfen
dc.language.isoenen
dc.publisherUral Federal Universityen
dc.relation.ispartofScanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. — Ekaterinburg, 2019en
dc.titleProbe microscopy for investigation of conical nanowiresen
dc.typeConference Paperen
dc.typeinfo:eu-repo/semantics/conferenceObjecten
dc.typeinfo:eu-repo/semantics/publishedVersionen
dc.conference.name3rd International Conference "Scanning Probe Microscopy" ; 4th Russia-China Workshop on Dielectric and Ferroelectric Materials ; International Youth Conference "Functional Imaging of nanomaterials"en
dc.conference.date25.08.2019-28.08.2019-
local.description.firstpage218-
local.description.lastpage218-
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