Please use this identifier to cite or link to this item: http://hdl.handle.net/10995/79087
Title: Crystal structure and growth kinetics of self-assembled microtubes with different chirality
Authors: Nuraeva, A. S.
Zelenovskiy, P. S.
Kopyl, S.
Arkhipov, S. G.
Vasilev, S. G.
Bystrov, V. S.
Gruzdev, D. A.
Waliczek, M.
Svitlyk, V.
Shur, V. Ya.
Mafra, L.
Kholkin, A. L.
Issue Date: 2019
Publisher: Ural Federal University
Citation: Crystal structure and growth kinetics of self-assembled microtubes with different chirality / A. S. Nuraeva, P. S. Zelenovskiy, S. Kopyl, S. G. Arkhipov, S. G. Vasilev, V. S. Bystrov, D. A. Gruzdev, M. Waliczek, V. Svitlyk, V. Ya. Shur, L. Mafra, A. L. Kholkin // Scanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. Abstract Book of Joint International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2019. — P. 214-215.
URI: http://hdl.handle.net/10995/79087
Conference name: 3rd International Conference "Scanning Probe Microscopy" ; 4th Russia-China Workshop on Dielectric and Ferroelectric Materials ; International Youth Conference "Functional Imaging of nanomaterials"
Conference date: 25.08.2019-28.08.2019
ISBN: 978-5-9500624-2-1
metadata.dc.description.sponsorship: The measurements of microtubes growth kinetics and morphology analysis were done in Ural Federal University (UrFU) and made possible by Russian Science Foundation (Grant No. 18-72-00052). The equipment of the Ural Center for Shared Use “Modern nanotechnology” UrFU was used. Computer simulation was performed under the support of Russian Foundation for Basic Research (Grant No. 19-01-00519 А). X-ray diffraction data were collected under the experiment SC-4587 at the European Synchrotron Radiation Source (ESRF, Grenoble, France). S.K., P.Z., L.M. and A.K. are grateful to FCT project PTDC/CTM-CTM/31679/2017. P.Z. and L.M. are grateful to FCT project PTDC/QEQ-QAN/6373/2014. S.K and A.K were also supported by the joint Portugal-Turkey project (TUBITAK/0006/2014). Part of this work was developed within the scope of the project CICECO-Aveiro Institute of Materials, FCT Ref. UID/CTM/50011/2019, financed by national funds through the FCT/MCTES.
RSCF project card: 18-72-00052
Origin: Scanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. — Ekaterinburg, 2019
Appears in Collections:Scanning Probe Microscopy

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