Please use this identifier to cite or link to this item:
https://elar.urfu.ru/handle/10995/79082Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Mukhin, I. S. | en |
| dc.contributor.author | Shkoldin, V. A. | en |
| dc.contributor.author | Permyakov, D. V. | en |
| dc.contributor.author | Ladutenko, K. S. | en |
| dc.contributor.author | Vasiliev, A. A. | en |
| dc.contributor.author | Uskov, A. V. | en |
| dc.contributor.author | Bogdanov, A. A. | en |
| dc.contributor.author | Golubok, A. O. | en |
| dc.contributor.author | Samusev, A. K. | en |
| dc.date.accessioned | 2019-12-19T12:26:09Z | - |
| dc.date.available | 2019-12-19T12:26:09Z | - |
| dc.date.issued | 2019 | - |
| dc.identifier.citation | Significant influence of metal surface morphology on photon emission from a local tunnel junction at ambient conditions / I. S. Mukhin, V. A. Shkoldin, D. V. Permyakov, K. S. Ladutenko, A. A. Vasiliev, A. V. Uskov, A. A. Bogdanov, A. O. Golubok, A. K. Samusev // Scanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. Abstract Book of Joint International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2019. — P. 208. | en |
| dc.identifier.isbn | 978-5-9500624-2-1 | - |
| dc.identifier.uri | http://elar.urfu.ru/handle/10995/79082 | - |
| dc.format.mimetype | application/pdf | en |
| dc.language.iso | en | en |
| dc.publisher | Ural Federal University | en |
| dc.relation.ispartof | Scanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. — Ekaterinburg, 2019 | en |
| dc.title | Significant influence of metal surface morphology on photon emission from a local tunnel junction at ambient conditions | en |
| dc.type | Conference Paper | en |
| dc.type | info:eu-repo/semantics/conferenceObject | en |
| dc.type | info:eu-repo/semantics/publishedVersion | en |
| dc.conference.name | 3rd International Conference "Scanning Probe Microscopy" ; 4th Russia-China Workshop on Dielectric and Ferroelectric Materials ; International Youth Conference "Functional Imaging of nanomaterials" | en |
| dc.conference.date | 25.08.2019-28.08.2019 | - |
| local.description.firstpage | 208 | - |
| local.description.lastpage | 208 | - |
| Appears in Collections: | Scanning Probe Microscopy | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 978-5-9500624-2-1_2019_168.pdf | 157,88 kB | Adobe PDF | View/Open |
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