Please use this identifier to cite or link to this item: http://hdl.handle.net/10995/79067
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dc.contributor.authorLi, S. H.en
dc.contributor.authorHu, K. J.en
dc.contributor.authorWang, J.en
dc.contributor.authorLiu, J. Y.en
dc.contributor.authorShen, X. Y.en
dc.contributor.authorZhang, Y.en
dc.date.accessioned2019-12-19T12:26:07Z-
dc.date.available2019-12-19T12:26:07Z-
dc.date.issued2019-
dc.identifier.citationNano-layered-structure interface and Zinc diffusion of borosilicate glass during sealing process / S. H. Li, K. J. Hu, J. Wang, J. Y. Liu, X. Y. Shen, Y. Zhang // Scanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. Abstract Book of Joint International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2019. — P. 192.en
dc.identifier.isbn978-5-9500624-2-1-
dc.identifier.urihttp://hdl.handle.net/10995/79067-
dc.format.mimetypeapplication/pdfen
dc.language.isoenen
dc.publisherUral Federal Universityen
dc.relation.ispartofScanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. — Ekaterinburg, 2019en
dc.titleNano-layered-structure interface and Zinc diffusion of borosilicate glass during sealing processen
dc.typeConference Paperen
dc.typeinfo:eu-repo/semantics/conferenceObjecten
dc.typeinfo:eu-repo/semantics/publishedVersionen
dc.conference.name3rd International Conference "Scanning Probe Microscopy" ; 4th Russia-China Workshop on Dielectric and Ferroelectric Materials ; International Youth Conference "Functional Imaging of nanomaterials"en
dc.conference.date25.08.2019-28.08.2019-
local.description.firstpage192-
local.description.lastpage192-
Appears in Collections:Scanning Probe Microscopy

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