Please use this identifier to cite or link to this item: http://hdl.handle.net/10995/79064
Title: Raman scattering study of SrTiO3: Bi ceramics with higher (x = 0.16) bismuth content
Authors: Krylova, S. N.
Vtyurin, A. N.
Krylov, A. S.
Wei, X.
Chen, W.
Issue Date: 2019
Publisher: Ural Federal University
Citation: Raman scattering study of SrTiO3: Bi ceramics with higher (x = 0.16) bismuth content / S. N. Krylova, A. N. Vtyurin, A. S. Krylov, X. Wei, W. Chen // Scanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. Abstract Book of Joint International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2019. — P. 188.
URI: http://hdl.handle.net/10995/79064
Conference name: 3rd International Conference "Scanning Probe Microscopy" ; 4th Russia-China Workshop on Dielectric and Ferroelectric Materials ; International Youth Conference "Functional Imaging of nanomaterials"
Conference date: 25.08.2019-28.08.2019
ISBN: 978-5-9500624-2-1
Origin: Scanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. — Ekaterinburg, 2019
Appears in Collections:Scanning Probe Microscopy

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