Please use this identifier to cite or link to this item: http://elar.urfu.ru/handle/10995/75698
Title: Resonant inelastic x-ray incarnation of Young’s double-slit experiment
Authors: Revelli, A.
Moretti, Sala, M.
Monaco, G.
Becker, P.
Bohatý, L.
Hermanns, M.
Koethe, T. C.
Fröhlich, T.
Warzanowski, P.
Lorenz, T.
Streltsov, S. V.
van, Loosdrecht, P. H. M.
Khomskii, D. I.
van, den, Brink, J.
Grüninger, M.
Issue Date: 2019
Publisher: American Association for the Advancement of Science
Citation: Resonant inelastic x-ray incarnation of Young’s double-slit experiment / A. Revelli, M. Moretti Sala, G. Monaco et al. // Science Advances. — 2019. — Vol. 5. — Iss. 1. — eaav4020.
Abstract: Young’s archetypal double-slit experiment forms the basis for modern diffraction techniques: The elastic scattering of waves yields an interference pattern that captures the real-space structure. Here, we report on an inelastic incarnation of Young’s experiment and demonstrate that resonant inelastic x-ray scattering (RIXS) measures interference patterns, which reveal the symmetry and character of electronic excited states in the same way as elastic scattering does for the ground state. A prototypical example is provided by the quasi-molecular electronic structure of insulating Ba 3 CeIr 2 O 9 with structural Ir dimers and strong spin-orbit coupling. The double “slits” in this resonant experiment are the highly localized core levels of the two Ir atoms within a dimer. The clear double-slit-type sinusoidal interference patterns that we observe allow us to characterize the electronic excitations, demonstrating the power of RIXS interferometry to unravel the electronic structure of solids containing, e.g., dimers, trimers, ladders, or other superstructures. Copyright © 2019 The Authors, some rights reserved;
Keywords: BARIUM COMPOUNDS
CERIUM COMPOUNDS
DIMERS
ELECTRIC EXCITATION
ELECTRON EMISSION
ELECTRONIC STRUCTURE
EXCITED STATES
GROUND STATE
X RAY SCATTERING
DIFFRACTION TECHNIQUES
DOUBLE-SLIT EXPERIMENT
ELECTRONIC EXCITATION
ELECTRONIC EXCITED STATE
INTERFERENCE PATTERNS
REAL SPACE STRUCTURE
RESONANT INELASTIC X-RAY SCATTERING
SINUSOIDAL INTERFERENCE PATTERN
ELASTIC SCATTERING
URI: http://elar.urfu.ru/handle/10995/75698
Access: info:eu-repo/semantics/openAccess
SCOPUS ID: 85060073689
WOS ID: 000457547900042
PURE ID: 8779139
ISSN: 2375-2548
DOI: 10.1126/sciadv.aav4020
metadata.dc.description.sponsorship: This project was funded by the Deutsche Forschungsgemeinschaft (DFG; German Research Foundation)—project numbers 277146847 and 247310070—CRC 1238 (projects A02, B01, B02, B03, and C02) and CRC 1143 (project A05), respectively. The work of S.V.S. was supported by the Russian Science Foundation through project 17-12-01207.
RSCF project card: 17-12-01207
Appears in Collections:Научные публикации, проиндексированные в SCOPUS и WoS CC

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