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dc.contributor.authorZhidkov, I. S.en
dc.contributor.authorKukharenko, A. I.en
dc.contributor.authorMaksimov, R. N.en
dc.contributor.authorFinkelstein, L. D.en
dc.contributor.authorCholakh, S. O.en
dc.contributor.authorOsipov, V. V.en
dc.contributor.authorKurmaev, E. Z.en
dc.date.accessioned2019-06-26T07:41:50Z-
dc.date.available2019-06-26T07:41:50Z-
dc.date.issued2019-
dc.identifier.citationOptical transparency and local electronic structure of Yb-doped Y 2 O 3 ceramics with tetravalent additives / I. S. Zhidkov, A. I. Kukharenko, R. N. Maksimov, et al. // Symmetry. — 2019. — Vol. 11. — Iss. 2. — 243. — DOI: 10.3390/sym11020243.en
dc.identifier.issn2073-8994-
dc.identifier.otherhttps://www.mdpi.com/2073-8994/11/2/243/pdfpdf
dc.identifier.other1good_DOI
dc.identifier.other0d5b9dc1-d95e-4d47-af04-5ace1448577bpure_uuid
dc.identifier.otherhttp://www.scopus.com/inward/record.url?partnerID=8YFLogxK&scp=85061844749m
dc.identifier.urihttp://elar.urfu.ru/handle/10995/73984-
dc.description.abstractThe results of optical transmission and X-ray core-level spectra measurements of Yb:Y 2 O 3 ceramics with different tetravalent sintering additives (ZrO 2 , CeO 2 and HfO 2 ) fabricated from nanopowders (produced by the laser ablation method) and then annealed at 1400 °C in air for 2 h are presented. It is found that the transmission values for ZrO 2 - and HfO 2 -doped ceramics at the lasing wavelengths are higher than those of CeO 2 -doped samples. The X-ray photoelectron spectra (XPS) O 1s spectra show that the relative intensity of oxygen defect peak detected for 3Yb:Y 2 O 3 + 5CeO 2 ceramics decreases substantially and consistently compared to that of 5Yb:Y 2 O 3 + 5HfO 2 and 3Yb:Y 2 O 3 + 5ZrO 2 samples. This can be attributed to a more complete filling of oxygen vacancies due to annealing-induced oxygen diffusion into the highly defective sintered ceramics. The measurements of XPS Ce 3d spectra showed that the insufficiently complete filling of the oxygen vacancies in the 3Yb:Y 2 O 3 + 5CeO 2 compound is due to the appreciable presence of trivalent cerium ions. © 2019 by the authors.en
dc.description.sponsorshipMinistry of Education and Science of the Russian Federation, Minobrnauka: 3.7270.2017/8.9en
dc.description.sponsorshipThis study was supported by FASO (Theme "Electron" No. AAAA-A18-118020190098-5). The XPS measurements were supported by the Ministry of Education and Science of the Russian Federation (Project No. 3.7270.2017/8.9) and the Government of the Russian Federation (Act 211, agreement No. 02.A03.21.0006). Fabrication of ceramic samples was performed in the framework of the state task of IEP UB RAS.en
dc.format.mimetypeapplication/pdfen
dc.language.isoenen
dc.publisherMDPI AGen
dc.rightscc-byother
dc.sourceSymmetryen
dc.subjectANNEALINGen
dc.subjectCERAMICen
dc.subjectELECTRONIC STRUCTUREen
dc.subjectTRANSMISSIONen
dc.subjectX-RAY PHOTOELECTRON SPECTRA (XPS)en
dc.subjectYTTRIUM OXIDEen
dc.titleOptical transparency and local electronic structure of Yb-doped Y 2 O 3 ceramics with tetravalent additivesen
dc.typeinfo:eu-repo/semantics/publishedVersionen
dc.typeinfo:eu-repo/semantics/articleen
dc.typeArticleen
dc.identifier.doi10.3390/sym11020243-
dc.identifier.scopus85061844749-
local.affiliationInstitute of Physics and Technology, Ural Federal University, Mira Str. 19, Yekaterinburg, 620002, Russian Federationen
local.affiliationInstitute of Electrophysics, Ural Branch of Russian Academy of Sciences, Amundsen Str. 106, Yekaterinburg, 620016, Russian Federationen
local.affiliationSEC 'Nanomaterials and nanotechnologies', Ural Federal University, Yekaterinburg, 620002, Russian Federationen
local.affiliationM.N. Mikheev Institute of Metal Physics, Ural Branch of Russian Academy of Sciences, S. Kovalevskoi Str. 18, Yekaterinburg, 620108, Russian Federationen
local.contributor.employeeЖидков Иван Сергеевичru
local.contributor.employeeКухаренко Андрей Игоревичru
local.contributor.employeeМаксимов Роман Николаевичru
local.contributor.employeeЧолах Сеиф Османовичru
local.contributor.employeeКурмаев Эрнст Загидовичru
local.issue2-
local.volume11-
dc.identifier.wos000460767300121-
local.contributor.departmentФизико-технологический институтru
local.identifier.pure9071021-
local.description.order243-
local.identifier.eid2-s2.0-85061844749-
local.identifier.wosWOS:000460767300121-
Располагается в коллекциях:Научные публикации ученых УрФУ, проиндексированные в SCOPUS и WoS CC

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