Please use this identifier to cite or link to this item: http://hdl.handle.net/10995/72271
Title: Electronic and structural characterisation of Cu3BiS3 thin films for the absorber layer of sustainable photovoltaics
Authors: Yakushev, M. V.
Maiello, P.
Raadik, T.
Shaw, M. J.
Edwards, P. R.
Krustok, J.
Mudryi, A. V.
Forbes, I.
Martin, R. W.
Якушев, М. В.
Issue Date: 2014
Citation: Electronic and structural characterisation of Cu3BiS3 thin films for the absorber layer of sustainable photovoltaics / M. V. Yakushev, P. Maiello, T. Raadik [et al.] // Thin Solid Films. — 2014. — Vol. 562. — P. 195-199. — DOI: 10.1016/j.tsf.2014.04.057.
URI: http://hdl.handle.net/10995/72271
SCOPUS ID: 84901772567
WOS ID: 000340658100030
PURE ID: 415385
ISSN: 0040-6090
DOI: 10.1016/j.tsf.2014.04.057
Appears in Collections:Научные публикации, проиндексированные в SCOPUS и WoS CC

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