Electronic and structural characterisation of Cu3BiS3 thin films for the absorber layer of sustainable photovoltaics

Please use this identifier to cite or link to this item: http://hdl.handle.net/10995/72271

Title:	Electronic and structural characterisation of Cu3BiS3 thin films for the absorber layer of sustainable photovoltaics
Authors:	Yakushev, M. V. Maiello, P. Raadik, T. Shaw, M. J. Edwards, P. R. Krustok, J. Mudryi, A. V. Forbes, I. Martin, R. W. Якушев, М. В.
Issue Date:	2014
Citation:	Electronic and structural characterisation of Cu3BiS3 thin films for the absorber layer of sustainable photovoltaics / M. V. Yakushev, P. Maiello, T. Raadik [et al.] // Thin Solid Films. — 2014. — Vol. 562. — P. 195-199. — DOI: 10.1016/j.tsf.2014.04.057.
URI:	http://hdl.handle.net/10995/72271
SCOPUS ID:	84901772567
WOS ID:	000340658100030
PURE ID:	415385
ISSN:	0040-6090
DOI:	10.1016/j.tsf.2014.04.057
Appears in Collections:	Научные публикации, проиндексированные в SCOPUS и WoS CC

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