Please use this identifier to cite or link to this item: http://hdl.handle.net/10995/51399
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dc.contributor.authorSokolov, V. I.en
dc.contributor.authorPustovarov, V. A.en
dc.contributor.authorChurmanov, V. N.en
dc.contributor.authorIvanov, V. Yu.en
dc.contributor.authorYermakov, A. Ye.en
dc.contributor.authorUimin, M. A.en
dc.contributor.authorGruzdev, N. B.en
dc.contributor.authorSokolov, P. S.en
dc.contributor.authorBaranov, A. N.en
dc.contributor.authorMoskvin, A. S.en
dc.contributor.authorПустоваров, В. А.ru
dc.date.accessioned2017-09-04T14:45:51Z-
dc.date.available2017-09-04T14:45:51Z-
dc.date.issued2012-
dc.identifier.issn1757-8981-
dc.identifier.other1good_DOI
dc.identifier.otherff95a787-7f44-4d43-a024-92f6d99b03dbpure_uuid
dc.identifier.otherhttp://www.scopus.com/inward/record.url?partnerID=8YFLogxK&scp=84874086273m
dc.identifier.urihttp://hdl.handle.net/10995/51399-
dc.identifier.urihttps://elar.urfu.ru/handle/10995/51399en
dc.description.abstractComparative analysis of photoluminescence (PL) and photoluminescence excitation (PLE) spectra of NiO poly- and nanocrystals in the spectral range 2-5.5 eV reveals two PLE bands peaked near 3.7 and 4.6 eV with a dramatic rise in the low-temperature PLE spectral weight of the 3.7 eV PLE band in the nanocrystalline NiO as compared with its polycrystalline counterpart. In frames of a cluster model approach we assign the 3.7 eV PLE band to the low-energy bulk-forbidden p-d (t1g(π)-eg) charge transfer (CT) transition which becomes the allowed one in the nanocrystalline state while the 4.6 eV PLE band is related to a bulk allowed d-d (eg-eg) CT transition scarcely susceptible to the nanocrystallization. The PLE spectroscopy of the nanocrystalline materials appears to be a novel informative technique for inspection of different CT transitions. © Published under licence by IOP Publishing Ltd.en
dc.format.mimetypeapplication/pdfen
dc.language.isoenen
dc.publisherIOP PUBLISHING LTDen
dc.rightsinfo:eu-repo/semantics/openAccessen
dc.sourceIOP Conference Series: Materials Science and Engineeringen
dc.titleLow-energy charge transfer excitations in NiOen
dc.typeConference Paperen
dc.typeinfo:eu-repo/semantics/publishedVersionen
dc.typeinfo:eu-repo/semantics/conferenceObjecten
dc.conference.nameInternational Conference on Functional Materials and Nanotechnologies, FM and NT 2012en
dc.conference.date17.04.2012-20.04.2012-
dc.identifier.doi10.1088/1757-899X/38/1/012007-
dc.identifier.scopus84874086273-
local.contributor.employeeСоколов Виктор Ивановичru
local.contributor.employeeПустоваров Владимир Алексеевичru
local.contributor.employeeЧурманов Владимир Николаевичru
local.contributor.employeeИванов Владимир Юрьевичru
local.contributor.employeeУймин Михаил Александровичru
local.contributor.employeeМосквин Александр Сергеевичru
local.volume38-
dc.identifier.wos000309665200007-
local.contributor.departmentИнститут естественных наук и математикиru
local.identifier.pure1595521-
local.identifier.eid2-s2.0-84874086273-
local.identifier.wosWOS:000309665200007-
Appears in Collections:Научные публикации, проиндексированные в SCOPUS и WoS CC

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