Пожалуйста, используйте этот идентификатор, чтобы цитировать или ссылаться на этот ресурс:
http://elar.urfu.ru/handle/10995/51269
Полная запись метаданных
Поле DC | Значение | Язык |
---|---|---|
dc.contributor.author | Budai, B. T. | en |
dc.contributor.author | Porodnov, V. T. | en |
dc.contributor.author | Myakutina, I. V. | en |
dc.contributor.author | Kasatkin, N. V. | en |
dc.date.accessioned | 2017-09-04T14:45:38Z | - |
dc.date.available | 2017-09-04T14:45:38Z | - |
dc.date.issued | 2012 | - |
dc.identifier.citation | The detection of flaws in optoelectronic systems / B. T. Budai, V. T. Porodnov, I. V. Myakutina, N. V. Kasatkin // Russian Journal of Nondestructive Testing. — 2012. — Vol. 48. — № 7. — P. 426-435. | en |
dc.identifier.issn | 1061-8309 | - |
dc.identifier.issn | 1608-3385 | - |
dc.identifier.other | 1 | good_DOI |
dc.identifier.other | 0daca642-c111-4ec6-9238-f5ab48bcf140 | pure_uuid |
dc.identifier.other | http://www.scopus.com/inward/record.url?partnerID=8YFLogxK&scp=84869055528 | m |
dc.identifier.uri | http://elar.urfu.ru/handle/10995/51269 | - |
dc.description.abstract | Potentially dangerous spots (PDSs), for example, leaks in product pipelines (oil and gas pipelines), are revealed using optoelectronic systems (OESs) that are usually mounted on airborne vehicles (e.g., helicopters). Earlier, a relevant problem consisted of revealing the onset of leaks in PDSs; however, today it is necessary to detect the PDSs of leaks in order to prevent their development. The complexity of the problem is related to the fact that product pipelines are most often located near densely populated areas and near reservoirs with drinking water. The appearance of PDSs is usually characterized by deviations in the temperature and other physical parameters from standard values in small areas. The detection of such spots necessitates decreasing the flying height of an OES carrier. As a rule, this yields a deterioration of imaging quality and OES overheating, which decreases the effi- ciency of this PDS detection method. Conservative OES developers believe that a low imaging quality and OES overheating result from random flaws in the OES assembly. Contrary to this, it is shown that failures occur due to a deterministic flaw at the stage of designing drives for an OES platform. © Pleiades Publishing, Ltd., 2012. | en |
dc.language.iso | en | en |
dc.publisher | Pleiades Publishing Ltd | en |
dc.source | Russian Journal of Nondestructive Testing | en |
dc.subject | AERODYNAMIC HEATING | en |
dc.subject | BODY OVERHEATING | en |
dc.subject | OPTOELECTRONIC SYSTEM | en |
dc.subject | RELEASED POWER | en |
dc.subject | THERMAL MODEL | en |
dc.title | The detection of flaws in optoelectronic systems | en |
dc.type | Article | en |
dc.type | info:eu-repo/semantics/publishedVersion | en |
dc.type | info:eu-repo/semantics/article | en |
dc.identifier.doi | 10.1134/S1061830912070029 | - |
dc.identifier.scopus | 84869055528 | - |
local.contributor.employee | Будаи Борис Тиборович | ru |
local.contributor.employee | Мякутина Ирина Викторовна | ru |
local.contributor.employee | Касаткин Николай Владиславович | ru |
local.description.firstpage | 426 | - |
local.description.lastpage | 435 | - |
local.issue | 7 | - |
local.volume | 48 | - |
local.contributor.department | Физико-технологический институт | ru |
local.identifier.pure | 1079428 | - |
local.identifier.eid | 2-s2.0-84869055528 | - |
Располагается в коллекциях: | Научные публикации ученых УрФУ, проиндексированные в SCOPUS и WoS CC |
Файлы этого ресурса:
Нет файлов, ассоциированных с этим ресурсом.
Все ресурсы в архиве электронных ресурсов защищены авторским правом, все права сохранены.