Please use this identifier to cite or link to this item: http://hdl.handle.net/10995/51228
Title: MxTiSe2 (M=Cr, Mn, Cu) electronic structure study by methods of resonance X-ray photoemission spectroscopy and X-ray absorption spectroscopy
Authors: Shkvarin, A. S.
Yarmoshenko, Yu. M.
Yablonskikh, M. V.
Skorikov, N. A.
Merentsov, A. I.
Kuznetsov, M. V.
Titov, A. N.
Issue Date: 2012
Citation: MxTiSe2 (M=Cr, Mn, Cu) electronic structure study by methods of resonance X-ray photoemission spectroscopy and X-ray absorption spectroscopy / A. S. Shkvarin, Yu. M. Yarmoshenko, M. V. Yablonskikh, N. A. Skorikov, A. I. Merentsov, M. V. Kuznetsov, A. N. Titov // Journal of Physics and Chemistry of Solids. — 2012. — Vol. 73. — № 12. — P. 1562-1565.
Abstract: Intercalation of Cu and Mn between the layers of TiSe 2 leads to the charge transfer from the doped atom to Ti atoms, electronic states of which form the conduction band of TiSe 2. This situation drastically differs from another one being observed during intercalation of other transition metals into TiSe 2 that leads to the formation of covalent complexes consisting of intercalated atom and nearest neighborhood of the host lattice. Substitution of Ti by Cr in the host lattice positions does not show both charge transfer nor formation of covalent complexes. © 2012 ElsevierLtd. Allrightsreserved.
Keywords: C. PHOTOELECTRON SPECTROSCOPY
D. ELECTRONIC STRUCTURE
URI: http://hdl.handle.net/10995/51228
https://elar.urfu.ru/handle/10995/51228
Access: info:eu-repo/semantics/restrictedAccess
SCOPUS ID: 84867576089
WOS ID: 000310925900038
PURE ID: 1069026
ISSN: 0022-3697
DOI: 10.1016/j.jpcs.2012.04.012
Appears in Collections:Научные публикации, проиндексированные в SCOPUS и WoS CC

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