Intrinsic UV-VUV luminescence and X-ray emission spectroscopy of BeO and multicomponent oxide dielectrics

Abstract

The experimental study of intrinsic UV-VUV luminescence and X-ray emission at the selective excitations near fundamental absorption edge as well as at the inner-shell excitations for binary BeO crystal and multicomponent oxide crystals Be 2Si0 4, Y 2Si0 5 and La 2Be 20 5 has been performed. The results show that relaxation during the time-scale of decay of short-living anion and cation excitations leads to creation of self-trapped excitons at the same low-symmetry local structural units of crystalline lattice. The applied experimental method gives an opportunity to clarify a participation of different crystalline units of complex oxides in the self-trapping of excitons. © 2012 - STC "Institute for Single Crystals".