Composition and submicron structure of chemically deposited Cu2Se-In2Se3 films

Abstract

Films of substitutional solid solutions of the Cu 2Se-In 2Se 3 system containing up to 7.5 at. % In have been obtained by chemical deposition from aqueous media. The composition, structure, and morphology of the films have been studied. Data of X-ray diffraction and X-ray photoelectron spectroscopy showed that copper in the solid solution occurs in a single-valence state (Cu +). The deposited layers possess a globular morphology and are nanostructured. © 2012 Pleiades Publishing, Ltd.