Please use this identifier to cite or link to this item: http://hdl.handle.net/10995/50965
Title: Nanostructured magnetoimpedance multilayers
Authors: Kurlyandskaya, G. V.
Garcia-Arribas, A.
Fernandez, E.
Svalov, A. V.
Issue Date: 2012
Citation: Nanostructured magnetoimpedance multilayers / G. V. Kurlyandskaya, A. Garcia-Arribas, E. Fernandez, A. V. Svalov // IEEE Transactions on Magnetics. — 2012. — Vol. 48. — № 4. — P. 1375-1380.
Abstract: We describe our experience in design, fabrication and advanced characterization of highly sensitive [FeNi/Ti]- and [FeNi/Cu]-n/Cu-based magnetoimpedance multilayers deposited by rf-sputtering onto rigid and flexible substrates. In order to avoid the transition into transcritical state and to keep both the low coercivity and magnetic softness for relatively thick films (up to 1 μm), nanostructuring by Ti or Cu layers was successfully used together with an appropriate selection of the thickness and deposition conditions. A maximum sensitivity of the total impedance of 110%/Oe at 30 MHz was obtained for [FeNi/Ti] 3Cu(500 nm) [Ti/FeNi] 3 multilayers deposited onto glass substrate (45%/Oe, at 65 MHz for the same multilayers deposited onto a flexible substrate). These values are promising for applications. © 2006 IEEE.
Keywords: MAGNETIC ANISOTROPY
MAGNETIC DOMAINS
MAGNETIC MULTILAYERS
MAGNETIC SENSORS
MAGNETOIMPEDANCE
URI: http://hdl.handle.net/10995/50965
https://elar.urfu.ru/handle/10995/50965
SCOPUS ID: 84859169911
WOS ID: 000302087800030
PURE ID: 1085412
ISSN: 0018-9464
1941-0069
DOI: 10.1109/TMAG.2011.2171330
Appears in Collections:Научные публикации, проиндексированные в SCOPUS и WoS CC

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