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dc.contributor.authorNastulyavichus, A.en
dc.contributor.authorKudryashov, S.en
dc.contributor.authorShelygina, S.en
dc.contributor.authorSmirnov, N.en
dc.contributor.authorPakholchuk, P.en
dc.contributor.authorSaraeva, I.en
dc.contributor.authorZayarny, D.en
dc.contributor.authorUlturgasheva, E.en
dc.contributor.authorKhmelenin, D.en
dc.contributor.authorEmelyanova, O.en
dc.contributor.authorPryakhina, V.en
dc.contributor.authorPokryshkin, N.en
dc.contributor.authorKuzmin, E.en
dc.contributor.authorGorevoy, A.en
dc.contributor.authorMinh, P. H.en
dc.contributor.authorVan, Duong, P.en
dc.date.accessioned2025-02-25T10:52:07Z-
dc.date.available2025-02-25T10:52:07Z-
dc.date.issued2024-
dc.identifier.citationNastulyavichus, A., Kudryashov, S., Shelygina, S., Smirnov, N., Pakholchuk, P., Saraeva, I., Zayarny, D., Ulturgasheva, E., Khmelenin, D., Emelyanova, O., Pryakhina, V., Pokryshkin, N., Kuzmin, E., Gorevoy, A., Minh, P., & Van Duong, P. (2024). One-Step Non-Contact Additive LIFT Printing of Silver Interconnectors for Flexible Printed Circuits. Photonics, 11(2), [119]. https://doi.org/10.3390/photonics11020119apa_pure
dc.identifier.issn2304-6732-
dc.identifier.otherFinal2
dc.identifier.otherAll Open Access; Gold Open Access3
dc.identifier.otherhttps://www.scopus.com/inward/record.uri?eid=2-s2.0-85187311770&doi=10.3390%2fphotonics11020119&partnerID=40&md5=e9baf9d49f517d745a6eb78184b236951
dc.identifier.otherhttps://www.mdpi.com/2304-6732/11/2/119/pdf?version=1706354491pdf
dc.identifier.urihttp://elar.urfu.ru/handle/10995/141657-
dc.description.abstractThe single-pass one-step method for printing conductive silver tracks on a glass surface, using the laser-induced forward transfer (LIFT) technique, was proposed, providing a unique opportunity for high-throughput printing of surface micro- and nanostructures with high electrical conductivity and positioning accuracy. This method was developed via our multi-parametric research, resulting in the selection of the optimal material, laser irradiation, and transfer conditions. Optical, scanning and transmission electron, and atomic force microscopy methods, as well as X-ray diffraction, were used to characterize the surface structure and phase state of the printed structures, while energy-dispersive X-ray and X-ray photoelectron microscopy were employed for their chemical microanalysis. Depending on the laser irradiation parameters, the specific electrical conductivity of the printed tracks varied from 0.18 to 83 kS/cm, approaching that of donor magnetron-sputtered films. This single-pass one-step method significantly facilitates fast, large-scale, on-demand local laser printing of metallic (sub)microcomponents of microelectronic devices. © 2024 by the authors.en
dc.description.sponsorshipRussian Academy of Sciences, РАН; Ministry of Education and Science of the Russian Federation, Minobrnauka, (075-15-2023-603); Ministry of Education and Science of the Russian Federation, Minobrnauka; Ministry of Science and Higher Education of the Russian Federationen
dc.description.sponsorshipFunding text 1: This research was supported by the Ministry of Science and Higher Education of the Russian Federation (agreement no. 075-15-2023-603).; Funding text 2: The equipment used was supplied by the Ural Center for Shared Use “Modern Nanotechnology” of Ural Federal University (Reg. no. 2968), which is supported by the Ministry of Science and Higher Education RF and of the Center for Collective Use “Structural Diagnostics of Materials” of the Federal Scientific Research Center “Crystallography and Photonics” of the Russian Academy of Sciences.en
dc.format.mimetypeapplication/pdfen
dc.language.isoenen
dc.publisherMultidisciplinary Digital Publishing Institute (MDPI)en
dc.rightsinfo:eu-repo/semantics/openAccessen
dc.rightscc-byother
dc.sourcePhotonics2
dc.sourcePhotonicsen
dc.subjectADDITIVE PRINTINGen
dc.subjectLIFTen
dc.subjectMICROELECTRONICSen
dc.subjectNANOMATERIALSen
dc.subjectSILVER NPSen
dc.titleOne-Step Non-Contact Additive LIFT Printing of Silver Interconnectors for Flexible Printed Circuitsen
dc.typeArticleen
dc.typeinfo:eu-repo/semantics/articleen
dc.typeinfo:eu-repo/semantics/publishedVersionen
dc.identifier.doi10.3390/photonics11020119-
dc.identifier.scopus85187311770-
local.contributor.employeeNastulyavichus A., P. N. Lebedev Physics Institute, Russian Academy of Sciences, Moscow, 119991, Russian Federationen
local.contributor.employeeKudryashov S., P. N. Lebedev Physics Institute, Russian Academy of Sciences, Moscow, 119991, Russian Federationen
local.contributor.employeeShelygina S., P. N. Lebedev Physics Institute, Russian Academy of Sciences, Moscow, 119991, Russian Federationen
local.contributor.employeeSmirnov N., P. N. Lebedev Physics Institute, Russian Academy of Sciences, Moscow, 119991, Russian Federationen
local.contributor.employeePakholchuk P., P. N. Lebedev Physics Institute, Russian Academy of Sciences, Moscow, 119991, Russian Federationen
local.contributor.employeeSaraeva I., P. N. Lebedev Physics Institute, Russian Academy of Sciences, Moscow, 119991, Russian Federationen
local.contributor.employeeZayarny D., P. N. Lebedev Physics Institute, Russian Academy of Sciences, Moscow, 119991, Russian Federationen
local.contributor.employeeUlturgasheva E., P. N. Lebedev Physics Institute, Russian Academy of Sciences, Moscow, 119991, Russian Federationen
local.contributor.employeeKhmelenin D., Institute of Crystallography, Branch of the Federal Scientific Research Centre “Crystallography and Photonics”, Russian Academy of Sciences, Moscow, 119333, Russian Federationen
local.contributor.employeeEmelyanova O., Institute of Crystallography, Branch of the Federal Scientific Research Centre “Crystallography and Photonics”, Russian Academy of Sciences, Moscow, 119333, Russian Federationen
local.contributor.employeePryakhina V., Department of Optoelectronics and Semiconductor Technology, Ural Federal University, Ekaterinburg, 620002, Russian Federationen
local.contributor.employeePokryshkin N., Faculty of Physics, M. V. Lomonosov Moscow State University, Moscow, 119991, Russian Federationen
local.contributor.employeeKuzmin E., P. N. Lebedev Physics Institute, Russian Academy of Sciences, Moscow, 119991, Russian Federationen
local.contributor.employeeGorevoy A., P. N. Lebedev Physics Institute, Russian Academy of Sciences, Moscow, 119991, Russian Federationen
local.contributor.employeeMinh P.H., Institute of Physics, Vietnam Academy of Science and Technology, Hanoi, 10000, Viet Namen
local.contributor.employeeVan Duong P., Institute of Physics, Vietnam Academy of Science and Technology, Hanoi, 10000, Viet Namen
local.issue2-
local.volume11-
dc.identifier.wos001172404300001-
local.contributor.departmentP. N. Lebedev Physics Institute, Russian Academy of Sciences, Moscow, 119991, Russian Federationen
local.contributor.departmentInstitute of Crystallography, Branch of the Federal Scientific Research Centre “Crystallography and Photonics”, Russian Academy of Sciences, Moscow, 119333, Russian Federationen
local.contributor.departmentDepartment of Optoelectronics and Semiconductor Technology, Ural Federal University, Ekaterinburg, 620002, Russian Federationen
local.contributor.departmentFaculty of Physics, M. V. Lomonosov Moscow State University, Moscow, 119991, Russian Federationen
local.contributor.departmentInstitute of Physics, Vietnam Academy of Science and Technology, Hanoi, 10000, Viet Namen
local.identifier.pure54326051-
local.description.order119
local.identifier.eid2-s2.0-85187311770-
local.fund.rsfRussian Academy of Sciences, РАН; Ministry of Education and Science of the Russian Federation, Minobrnauka, (075-15-2023-603); Ministry of Education and Science of the Russian Federation, Minobrnauka; Ministry of Science and Higher Education of the Russian Federation
local.fund.rsfFunding text 1: This research was supported by the Ministry of Science and Higher Education of the Russian Federation (agreement no. 075-15-2023-603).; Funding text 2: The equipment used was supplied by the Ural Center for Shared Use “Modern Nanotechnology” of Ural Federal University (Reg. no. 2968), which is supported by the Ministry of Science and Higher Education RF and of the Center for Collective Use “Structural Diagnostics of Materials” of the Federal Scientific Research Center “Crystallography and Photonics” of the Russian Academy of Sciences.
local.identifier.wosWOS:001172404300001-
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