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Title: Organizational factors for manufacturing defects reduction in small batch production
Authors: Ershova, I. V.
Baranchikova, S. G.
Cherepanova, E. V.
Chistyakov, N. N.
Issue Date: 2020
Publisher: IOP Publishing Ltd
Citation: Organizational factors for manufacturing defects reduction in small batch production / I. V. Ershova, S. G. Baranchikova, E. V. Cherepanova et al. // IOP Conference Series: Materials Science and Engineering. — 2020. — Vol. 966. — Iss. 1. — 12091.
Abstract: The study is devoted to the defects organizational causes analysis in the machine building products production process. The companies with the small batch production were taken into consideration. Factors related to the time norms fulfilling percentage, the work rhythm, the consolidation of operations at one workplace, the new technologies introduction and equipment failures were chosen. A preliminary factors selection according to independence criteria allowed us to build a reliable regression model for the defects rate calculating. The main factors influencing the defects rate in small batch production are the time norms fulfilling percentage, the rate of consolidation of operations at one workplace, and the number of new technological processes introduced. This allowed us to offer recommendations on the machining sites work organization. The final operations and productswhich are made from expensive metals should be carried out at workplaces with a low rate of operations consolidation. Also, it is important that the wage system should not contribute to over-fulfillment of norms. The maintenance and repair system should prevent malfunctions during operations fulfilment. © Published under licence by IOP Publishing Ltd.
Access: info:eu-repo/semantics/openAccess
Conference name: 15th International Conference on Industrial Manufacturing and Metallurgy, ICIMM 2020
Conference date: 18 June 2020 through 19 June 2020
SCOPUS ID: 85097057206
ISSN: 17578981
DOI: 10.1088/1757-899X/966/1/012091
Appears in Collections:Научные публикации, проиндексированные в SCOPUS и WoS CC

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