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dc.contributor.authorTiwari, D.en
dc.contributor.authorYakushev, M. V.en
dc.contributor.authorKoehler, T.en
dc.contributor.authorCattelan, M.en
dc.contributor.authorFox, N.en
dc.contributor.authorMartin, R. W.en
dc.contributor.authorKlenk, R.en
dc.contributor.authorFérmin, D. J.en
dc.date.accessioned2022-10-19T05:22:35Z-
dc.date.available2022-10-19T05:22:35Z-
dc.date.issued2022-
dc.identifier.citationMapping the Energetics of Defect States in Cu2ZnSnS4films and the Impact of Sb Doping / D. Tiwari, M. V. Yakushev, T. Koehler et al. // ACS Applied Energy Materials. — 2022. — Vol. 5. — Iss. 4. — P. 3933-3940.en
dc.identifier.issn25740962-
dc.identifier.otherhttps://www.scopus.com/inward/record.uri?eid=2-s2.0-85127594918&doi=10.1021%2facsaem.1c03729&partnerID=40&md5=a3f4f83e165acd11fbf8cf0e06bbef3alink
dc.identifier.urihttp://elar.urfu.ru/handle/10995/118126-
dc.description.abstractThe sub-bandgap levels associated with defect states in Cu2ZnSnS4(CZTS) thin films are investigated by correlating the temperature dependence of the absorber photoluminescence (PL) with the device admittance spectroscopy. CZTS thin films are prepared by thermolysis of molecular precursors incorporating chloride salts of the cations and thiourea. Na and Sb are introduced as dopants in the precursor layers to assess their impact on Cu/Zn and Sn site disorder, respectively. Systematic analysis of PL spectra as a function of excitation power and temperature show that radiative recombination is dominated by quasi-donor-acceptor pairs (QDAP) with a maximum between 1.03 and 1.18 eV. It is noteworthy that Sb doping leads to a transition from localized to delocalized QDAP. The activation energies obtained associated with QDAP emission closely correlate with the activation energies of the admittance responses in a temperature range between 150 K and room temperature in films with or without added dopants. Admittance data of CZTS films with no added dopants also have a strong contribution from a deeper state associated with Sn disorder. The ensemble of PL and admittance data, in addition to energy-filtered photoemission of electron microscopy (EF-PEEM), shows a detailed picture of the distribution of sub-bandgap states in CZTS and the impact of doping on their energetics and device performance. © 2022 American Chemical Society. All rights reserved.en
dc.description.sponsorshipEngineering and Physical Sciences Research Council, EPSRC: EP/K035746/1, EP/L017792/1, EP/M000605/1, EP/V008676/1, EP/V008692/1; Royal Society of Chemistry, RSC: E20-9404; Ministry of Education and Science of the Russian Federation, Minobrnauka: AAAA-A18-118020290104-2en
dc.description.sponsorshipD.T., M.C., N.F., and D.J.F. acknowledge the UK Engineering and Physical Sciences Research Council (EPSRC) for the financial contribution through the grants EP/L017792/1, EP/V008692/1, and EP/V008676/1 and the strategic equipment grants EP/K035746/1 and EP/M000605/1. D.T. is also thankful to the Royal Society of Chemistry for support through grant E20-9404. M.V.Y. is grateful for research support by the state assignment of Ministry of Science and Higher Education of the Russian Federation (“Spin” No. AAAA-A18-118020290104-2). The authors are indebted for access to the facilities at the Department of Physics, SUPA, Strathclyde University.en
dc.format.mimetypeapplication/pdfen
dc.language.isoenen
dc.publisherAmerican Chemical Societyen
dc.rightsinfo:eu-repo/semantics/openAccessen
dc.sourceACS Applied Energy Materialsen
dc.subjectADMITTANCE SPECTROSCOPYen
dc.subjectCU2ZNSNS4FILMSen
dc.subjectDEFECT STATESen
dc.subjectPHOTOEMISSION ELECTRON MICROSCOPYen
dc.subjectPHOTOLUMINESCENCEen
dc.subjectQUASI-DONOR-ACCEPTOR PAIRSen
dc.subjectSB DOPINGen
dc.subjectACTIVATION ENERGYen
dc.subjectCHLORINE COMPOUNDSen
dc.subjectCOPPER COMPOUNDSen
dc.subjectDEEP LEVEL TRANSIENT SPECTROSCOPYen
dc.subjectDEFECT STATESen
dc.subjectELECTRON MICROSCOPESen
dc.subjectELECTRON MICROSCOPYen
dc.subjectPHOTOEMISSIONen
dc.subjectPHOTOLUMINESCENCEen
dc.subjectSEMICONDUCTOR DOPINGen
dc.subjectTEMPERATURE DISTRIBUTIONen
dc.subjectTHIN FILMSen
dc.subjectZINC COMPOUNDSen
dc.subjectADMITTANCE SPECTROSCOPIESen
dc.subjectCU2ZNSNS4FILMen
dc.subjectCZTS THIN FILMSen
dc.subjectDEFECT STATEen
dc.subjectDONOR-ACCEPTOR PAIRSen
dc.subjectPHOTOEMISSION ELECTRON MICROSCOPYen
dc.subjectQUASI-DONOR-ACCEPTOR PAIRen
dc.subjectSB DOPINGen
dc.subjectSUB-BANDGAPen
dc.subjectTEMPERATURE DEPENDENCEen
dc.subjectTIN COMPOUNDSen
dc.titleMapping the Energetics of Defect States in Cu2ZnSnS4films and the Impact of Sb Dopingen
dc.typeReviewen
dc.typeinfo:eu-repo/semantics/reviewen
dc.typeinfo:eu-repo/semantics/publishedVersionen
dc.identifier.doi10.1021/acsaem.1c03729-
dc.identifier.scopus85127594918-
local.contributor.employeeTiwari, D., Department of Mathematics, Physics and Electrical Engineering, Northumbria University, Ellison Place, Newcastle upon Tyne, NE1 8ST, United Kingdom, School of Chemistry, University of Bristol, Cantocks Close, Bristol, BS8 1TS, United Kingdomen
local.contributor.employeeYakushev, M.V., Department of Physics, SUPA, Strathclyde University, Glasgow, G4 0NG, United Kingdom, M.N. Miheev Institute of Metal Physics of the UB RAS, 18 S. Kovalevskoy St., Ekaterinburg, 620108, Russian Federation, Ural Federal University, 19 Mira St., Ekaterinburg, 620002, Russian Federation, Institute of Solid-State Chemistry of the UB RAS, Ekaterinburg, 620990, Russian Federationen
local.contributor.employeeKoehler, T., Faculty of Physics, University of Duisburg-Essen, Forsthausweg 2, Duisburg, 47057, Germanyen
local.contributor.employeeCattelan, M., School of Chemistry, University of Bristol, Cantocks Close, Bristol, BS8 1TS, United Kingdomen
local.contributor.employeeFox, N., School of Chemistry, University of Bristol, Cantocks Close, Bristol, BS8 1TS, United Kingdom, H. H. Wills Physics Laboratory, University of Bristol, Tyndall Avenue, Bristol, BS8 1TL, United Kingdomen
local.contributor.employeeMartin, R.W., Department of Physics, SUPA, Strathclyde University, Glasgow, G4 0NG, United Kingdomen
local.contributor.employeeKlenk, R., Helmholtz-Zentrum Berlin für Materialien und Energie, Hahn-Meitner-Platz 1, Berlin, D-14109, Germanyen
local.contributor.employeeFérmin, D.J., School of Chemistry, University of Bristol, Cantocks Close, Bristol, BS8 1TS, United Kingdomen
local.description.firstpage3933-
local.description.lastpage3940-
local.issue4-
local.volume5-
dc.identifier.wos000813076500001-
local.contributor.departmentDepartment of Mathematics, Physics and Electrical Engineering, Northumbria University, Ellison Place, Newcastle upon Tyne, NE1 8ST, United Kingdomen
local.contributor.departmentSchool of Chemistry, University of Bristol, Cantocks Close, Bristol, BS8 1TS, United Kingdomen
local.contributor.departmentDepartment of Physics, SUPA, Strathclyde University, Glasgow, G4 0NG, United Kingdomen
local.contributor.departmentM.N. Miheev Institute of Metal Physics of the UB RAS, 18 S. Kovalevskoy St., Ekaterinburg, 620108, Russian Federationen
local.contributor.departmentUral Federal University, 19 Mira St., Ekaterinburg, 620002, Russian Federationen
local.contributor.departmentInstitute of Solid-State Chemistry of the UB RAS, Ekaterinburg, 620990, Russian Federationen
local.contributor.departmentFaculty of Physics, University of Duisburg-Essen, Forsthausweg 2, Duisburg, 47057, Germanyen
local.contributor.departmentH. H. Wills Physics Laboratory, University of Bristol, Tyndall Avenue, Bristol, BS8 1TL, United Kingdomen
local.contributor.departmentHelmholtz-Zentrum Berlin für Materialien und Energie, Hahn-Meitner-Platz 1, Berlin, D-14109, Germanyen
local.identifier.pure30101352-
local.identifier.eid2-s2.0-85127594918-
local.identifier.wosWOS:000813076500001-
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