Please use this identifier to cite or link to this item: http://elar.urfu.ru/handle/10995/118035
Title: Phenomenon of relaxation of inhomogeneous elastic rotational curvature of the lattice of nanofine spatial dissipative structures of hexagonal selenium
Authors: Malkov, V. B.
Chemezov, O. V.
Pushin, V. G.
Malkov, A. V.
Shulgin, B. V.
Malkov, O. V.
Issue Date: 2020
Publisher: IOP Publishing Ltd
Citation: Phenomenon of relaxation of inhomogeneous elastic rotational curvature of the lattice of nanofine spatial dissipative structures of hexagonal selenium / V. B. Malkov, O. V. Chemezov, V. G. Pushin et al. // IOP Conference Series: Materials Science and Engineering. — 2020. — Vol. 966. — Iss. 1. — 12030.
Abstract: Nanofine rhomboid spatial dissipative structures (NRSDS) of hexagonal selenium were found and studied by means of transmission electron microscopy in amorphous Se films coated with nanofine layers of amorphous carbon, at a temperature of their thermo gradient treatment of 423 K. As a result, pictures were received of fan-shaped linear bending extinction contours on the electron-microscopic images of NRSDS. It was shown that in the above NRSDS take place continuous linear increase in the bend radius of the lattice along [001], due to continuous linear relaxation of the inhomogeneous elastic torsion of the lattice around [001]. The continuous linear relaxation of the elastic rotational curvature of the lattice around [001] in NRSDS of hexagonal selenium with inhomogeneous elastic rotational curvature of the lattice covers the entire nanofine rhomboid spatial dissipative structures, and not its part, as is the case with the formation of interblock boundaries in the nanofine rhomboid spatial dissipative structures. © Published under licence by IOP Publishing Ltd.
URI: http://elar.urfu.ru/handle/10995/118035
Access: info:eu-repo/semantics/openAccess
Conference name: 15th International Conference on Industrial Manufacturing and Metallurgy, ICIMM 2020
Conference date: 18 June 2020 through 19 June 2020
SCOPUS ID: 85097089211
PURE ID: 20233627
ISSN: 17578981
DOI: 10.1088/1757-899X/966/1/012030
Appears in Collections:Научные публикации ученых УрФУ, проиндексированные в SCOPUS и WoS CC

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