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dc.contributor.authorMostafa, M.en
dc.contributor.authorSaleh, O.en
dc.contributor.authorHenaish, A. M.en
dc.contributor.authorEl-Kaream, S. A. A.en
dc.contributor.authorGhazy, R.en
dc.contributor.authorHemeda, O. M.en
dc.contributor.authorDorgham, A. M.en
dc.contributor.authorAl-Ghamdi, H.en
dc.contributor.authorAlmuqrin, A. H.en
dc.contributor.authorSayyed, M. I.en
dc.contributor.authorTrukhanov, S. V.en
dc.contributor.authorTrukhanova, E. L.en
dc.contributor.authorTrukhanov, A. V.en
dc.contributor.authorZhou, D.en
dc.contributor.authorDarwish, M. A.en
dc.date.accessioned2022-10-19T05:19:35Z-
dc.date.available2022-10-19T05:19:35Z-
dc.date.issued2022-
dc.identifier.citationStructure, Morphology and Electrical/Magnetic Properties of Ni-Mg Nano-Ferrites from a New Perspective / M. Mostafa, O. Saleh, A. M. Henaish et al. // Nanomaterials. — 2022. — Vol. 12. — Iss. 7. — 1045.en
dc.identifier.issn20794991-
dc.identifier.otherhttps://www.scopus.com/inward/record.uri?eid=2-s2.0-85126996833&doi=10.3390%2fnano12071045&partnerID=40&md5=d78091568cf10ceec182166e471672a8link
dc.identifier.urihttp://elar.urfu.ru/handle/10995/117805-
dc.description.abstractUsing the auto combustion flash method, Ni1−x+2 Mg+2xFe+32O4 (x = 0, 0.2, 0.6, 0.8 and 1) nano-ferrites were synthesized. All samples were thermally treated at 973 K for 3 h. The structural analysis for the synthesized samples was performed using XRD, high-resolution transmission electron microscopy (HRTEM), and FTIR. Scanning electron microscopy (SEM) was undertaken to explore the surface morphology of all the samples. The thermal stability of these samples was investigated using thermogravimetric analysis (TGA). XRD data show the presence of a single spinel phase for all the prepared samples. The intensity of the principal peak of the spinel phase decreases as Mg content increases, showing that Mg delays crystallinity. The Mg content raised the average grain size (D) from 0.084 µm to 0.1365 µm. TGA shows two stages of weight loss variation. The vibrating sample magnetometer (VSM) measurement shows that magnetic parameters, such as initial permeability (µi) and saturation magnetization (Ms), decay with rising Mg content. The permeability and magnetic anisotropy at different frequencies and temperatures were studied to show the samples’ magnetic behavior and determine the Curie temperature (TC), which depends on the internal structure. The electrical resistivity behavior shows the semi-conductivity trend of the samples. Finally, the dielectric constant increases sharply at high temperatures, explained by the increased mobility of charge carriers, and decreases with increasing frequency. © 2022 by the authors. Licensee MDPI, Basel, Switzerland.en
dc.description.sponsorshipPrincess Nourah Bint Abdulrahman University, PNU: PNURSP2022R28en
dc.description.sponsorshipThe authors express their gratitude to Princess Nourah bint Abdulrahman University Researchers Supporting Project number (PNURSP2022R28), Princess Nourah bint Abdulrahman University, Riyadh, Saudi Arabia.en
dc.format.mimetypeapplication/pdfen
dc.language.isoenen
dc.publisherMDPIen
dc.rightsinfo:eu-repo/semantics/openAccessen
dc.sourceNanomaterialsen
dc.subjectCURIE TEMPERATUREen
dc.subjectDIELECTRIC PROPERTIESen
dc.subjectFLASH AUTO COMBUSTION METHODen
dc.subjectMAGNETIC PROPERTIESen
dc.subjectNANO-SPINEL FERRITEen
dc.subjectPERMEABILITYen
dc.titleStructure, Morphology and Electrical/Magnetic Properties of Ni-Mg Nano-Ferrites from a New Perspectiveen
dc.typeArticleen
dc.typeinfo:eu-repo/semantics/articleen
dc.typeinfo:eu-repo/semantics/publishedVersionen
dc.identifier.doi10.3390/nano12071045-
dc.identifier.scopus85126996833-
local.contributor.employeeMostafa, M., Physics Department, Faculty of Science, Tanta University, Al-Geish St, Tanta, 31527, Egypten
local.contributor.employeeSaleh, O., Physics Department, Faculty of Science, Tanta University, Al-Geish St, Tanta, 31527, Egypten
local.contributor.employeeHenaish, A.M., Physics Department, Faculty of Science, Tanta University, Al-Geish St, Tanta, 31527, Egypt, NANOTECH Center, Ural Federal University, Yekaterinburg, 620002, Russian Federationen
local.contributor.employeeEl-Kaream, S.A.A., Department of Applied Medical Chemistry, Medical Research Institute, Alexandria University, Alexandria, 21526, Egypten
local.contributor.employeeGhazy, R., Physics Department, Faculty of Science, Tanta University, Al-Geish St, Tanta, 31527, Egypten
local.contributor.employeeHemeda, O.M., Physics Department, Faculty of Science, Tanta University, Al-Geish St, Tanta, 31527, Egypten
local.contributor.employeeDorgham, A.M., Physics Department, Faculty of Science, Tanta University, Al-Geish St, Tanta, 31527, Egypt, Basic Science Department, Higher Institute of Engineering and Technology, Tanta, 31739, Egypten
local.contributor.employeeAl-Ghamdi, H., Department of Physics, College of Science, Princess Nourah Bint Abdulrahman University, Riyadh, 11671, Saudi Arabiaen
local.contributor.employeeAlmuqrin, A.H., Department of Physics, College of Science, Princess Nourah Bint Abdulrahman University, Riyadh, 11671, Saudi Arabiaen
local.contributor.employeeSayyed, M.I., Department of Physics, Faculty of Science, Isra University, Amman, 11622, Jordan, Department of Nuclear Medicine Research, Institute for Research and Medical Consultations (IRMC), Imam Abdulrahman Bin Faisal University (IAU), Dammam, 31441, Saudi Arabiaen
local.contributor.employeeTrukhanov, S.V., Laboratory of Magnetic Films Physics, SSPA “Scientific and Practical Materials Research Centre of NAS of Belarus”, 19, P. Brovki Str, Minsk, 220072, Belarusen
local.contributor.employeeTrukhanova, E.L., Laboratory of Magnetic Films Physics, SSPA “Scientific and Practical Materials Research Centre of NAS of Belarus”, 19, P. Brovki Str, Minsk, 220072, Belarusen
local.contributor.employeeTrukhanov, A.V., Laboratory of Magnetic Films Physics, SSPA “Scientific and Practical Materials Research Centre of NAS of Belarus”, 19, P. Brovki Str, Minsk, 220072, Belarus, Laboratory of Single Crystal Growth, South Ural State University, 76, Lenin Av., Chelyabinsk, 454080, Russian Federation, Department of Electronic Materials Technology, National University of Science and Technology MISiS, Moscow, 119049, Russian Federationen
local.contributor.employeeZhou, D., Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education & International Center for Dielectric Research, School of Electronic Science and Engineering, Xi’an Jiaotong University, Xi’an, 710049, Chinaen
local.contributor.employeeDarwish, M.A., Physics Department, Faculty of Science, Tanta University, Al-Geish St, Tanta, 31527, Egypten
local.issue7-
local.volume12-
dc.identifier.wos000782043300001-
local.contributor.departmentPhysics Department, Faculty of Science, Tanta University, Al-Geish St, Tanta, 31527, Egypten
local.contributor.departmentNANOTECH Center, Ural Federal University, Yekaterinburg, 620002, Russian Federationen
local.contributor.departmentDepartment of Applied Medical Chemistry, Medical Research Institute, Alexandria University, Alexandria, 21526, Egypten
local.contributor.departmentBasic Science Department, Higher Institute of Engineering and Technology, Tanta, 31739, Egypten
local.contributor.departmentDepartment of Physics, College of Science, Princess Nourah Bint Abdulrahman University, Riyadh, 11671, Saudi Arabiaen
local.contributor.departmentDepartment of Physics, Faculty of Science, Isra University, Amman, 11622, Jordanen
local.contributor.departmentDepartment of Nuclear Medicine Research, Institute for Research and Medical Consultations (IRMC), Imam Abdulrahman Bin Faisal University (IAU), Dammam, 31441, Saudi Arabiaen
local.contributor.departmentLaboratory of Magnetic Films Physics, SSPA “Scientific and Practical Materials Research Centre of NAS of Belarus”, 19, P. Brovki Str, Minsk, 220072, Belarusen
local.contributor.departmentLaboratory of Single Crystal Growth, South Ural State University, 76, Lenin Av., Chelyabinsk, 454080, Russian Federationen
local.contributor.departmentDepartment of Electronic Materials Technology, National University of Science and Technology MISiS, Moscow, 119049, Russian Federationen
local.contributor.departmentElectronic Materials Research Laboratory, Key Laboratory of the Ministry of Education & International Center for Dielectric Research, School of Electronic Science and Engineering, Xi’an Jiaotong University, Xi’an, 710049, Chinaen
local.identifier.pure29934680-
local.description.order1045-
local.identifier.eid2-s2.0-85126996833-
local.identifier.wosWOS:000782043300001-
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