Please use this identifier to cite or link to this item:
Title: SRIM Simulation of Carbon Ions Interaction with Ni Nanotubes
Authors: Kaniukov, E.
Kutuzau, M.
Bundyukova, V.
Yakimchuk, D.
Kozlovskiy, A.
Borgekov, D.
Zdorovets, M.
Shlimas, D.
Shumskaya, A.
Issue Date: 2018
Publisher: Elsevier Ltd
Elsevier BV
Citation: SRIM Simulation of Carbon Ions Interaction with Ni Nanotubes / E. Kaniukov, M. Kutuzau, V. Bundyukova et al. // Materials Today: Proceedings. — 2018. — Vol. 7. — P. 872-877.
Abstract: By template synthesis method nickel nanotubes with diameter of 400 nm and length of 12 μm were produced in the pores of PET template. The nanotubes were modified by irradiation with carbon ions with energy of 28 MeV and a dose of 5 × 1011 cm-2. To ensure the maximum efficiency of nanostructures modification process, energy of irradiation was decided by using of SRIM software. Based on SRIM simulation of carbon ions interaction with Ni nanotubes, the areas on which effect of high energy ions will maximum were predicted. A comparative analysis of nanostructures before and after irradiation was carried out by scanning electron microscopy. The maximum change in nanotubes morphology, in the form of destruction of walls, was appeared at a distance of about 10 μm from the start point of C3+ ions track inside the nanotubes. A substantiation of reason of wall degradation in this area was proposed. © 2019 Elsevier Ltd.
Access: info:eu-repo/semantics/openAccess
Conference name: 2017 Functional Integrated nano Systems, nanoFIS 2017
Conference date: 22 November 2017 through 24 November 2017
SCOPUS ID: 85073165290
PURE ID: 9185913
ISSN: 2214-7853
metadata.dc.description.sponsorship: Horizon 2020 Framework Programme, H2020: 778308.
CORDIS project card: H2020: 778308
Appears in Collections:Научные публикации, проиндексированные в SCOPUS и WoS CC

Files in This Item:
File Description SizeFormat 
2-s2.0-85073165290.pdf1,25 MBAdobe PDFView/Open

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.