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http://elar.urfu.ru/handle/10995/111976
Название: | Structural Characterization and Gamma-Ray Attenuation Properties of Rice-Like α-TeO2 Crystalline Microstructures (CMS) Grown Rapidly on Free Surface of Tellurite-Based Glasses |
Авторы: | ALMisned, G. Kilic, G. Ilik, E. Issa, S. A. M. Zakaly, H. M. H. Badawi, A. Issever, U. G. Tekin, H. O. Ene, A. |
Дата публикации: | 2022 |
Издатель: | Elsevier Editora Ltda Elsevier BV |
Библиографическое описание: | Structural Characterization and Gamma-Ray Attenuation Properties of Rice-Like α-TeO2 Crystalline Microstructures (CMS) Grown Rapidly on Free Surface of Tellurite-Based Glasses / G. ALMisned, G. Kilic, E. Ilik et al. // Journal of Materials Research and Technology. — 2022. — Vol. 16. — P. 1179-1189. |
Аннотация: | In this study, we extensively analyzed the structural, physical and gamma-ray attenuation properties of α-TeO2 CMS, which has unexpectedly been observed as a part of Sm2O3 doped TeO2–B2O3–V2O5 glasses synthesis process. The shape of α-TeO2 CMS was obtained from SEM analyses. Moreover, EDX, XRD and Raman examinations were utilized for systematic characterization of α-TeO2 CMS. In addition to experimental physical and structural studies on α-TeO2 CMSs, gamma-ray attenuation properties were also determined and compared with Quartz and some novel glasses such as PNCKM5, C25, SCNZ7 along with some commercial glasses such as RS253, RS253G18, RS323G19, RS360, RS520 using FLUKA general-purpose Monte Carlo code. EDX results indicated that only Te and O elements were available in the α-TeO2 CMS. The finding showed that gamma-ray attenuation competencies of α-TeO2 CMS is higher than many novel and commercial glasses in addition to traditional concrete shields. It can be concluded that further comparison studies can be done between normal glass structure and α-TeO2 CMS (or similar) occurred glass structures in terms of better understanding the total gamma-ray attenuation and the effect of α-TeO2 CMS. © 2021 The Author(s). |
Ключевые слова: | CRYSTALLINE MICROSTRUCTURES EDX FLUKA RAMAN SM2O3 GLASSES XRD ELECTROMAGNETIC WAVE ATTENUATION GAMMA RAYS GLASS MICROSTRUCTURE SAMARIUM COMPOUNDS TELLURIUM COMPOUNDS VANADIUM PENTOXIDE ATTENUATION PROPERTIES COMMERCIAL GLASS CRYSTALLINE MICROSTRUCTURE FLUKA GAMMA-RAY ATTENUATION GLASS STRUCTURE NOVEL GLASS RAMAN SM2O3 GLASS XRD X RAY DIFFRACTION |
URI: | http://elar.urfu.ru/handle/10995/111976 |
Условия доступа: | info:eu-repo/semantics/openAccess |
Идентификатор РИНЦ: | 47548854 |
Идентификатор SCOPUS: | 85121902208 |
Идентификатор WOS: | 000782650200003 |
Идентификатор PURE: | 29211029 |
ISSN: | 2238-7854 |
DOI: | 10.1016/j.jmrt.2021.12.059 |
Сведения о поддержке: | The authors thank Taif University Researchers Supporting Project number (TURSP-2020/12), Taif University, Taif, Saudi Arabia. The APC was covered by "Dunarea de Jos" University of Galati, Romania. |
Располагается в коллекциях: | Научные публикации ученых УрФУ, проиндексированные в SCOPUS и WoS CC |
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Файл | Описание | Размер | Формат | |
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2-s2.0-85121902208.pdf | 4,61 MB | Adobe PDF | Просмотреть/Открыть |
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