Please use this identifier to cite or link to this item: http://hdl.handle.net/10995/111976
Title: Structural Characterization and Gamma-Ray Attenuation Properties of Rice-Like α-TeO2 Crystalline Microstructures (CMS) Grown Rapidly on Free Surface of Tellurite-Based Glasses
Authors: ALMisned, G.
Kilic, G.
Ilik, E.
Issa, S. A. M.
Zakaly, H. M. H.
Badawi, A.
Issever, U. G.
Tekin, H. O.
Ene, A.
Issue Date: 2022
Publisher: Elsevier Editora Ltda
Elsevier BV
Citation: Structural Characterization and Gamma-Ray Attenuation Properties of Rice-Like α-TeO2 Crystalline Microstructures (CMS) Grown Rapidly on Free Surface of Tellurite-Based Glasses / G. ALMisned, G. Kilic, E. Ilik et al. // Journal of Materials Research and Technology. — 2022. — Vol. 16. — P. 1179-1189.
Abstract: In this study, we extensively analyzed the structural, physical and gamma-ray attenuation properties of α-TeO2 CMS, which has unexpectedly been observed as a part of Sm2O3 doped TeO2–B2O3–V2O5 glasses synthesis process. The shape of α-TeO2 CMS was obtained from SEM analyses. Moreover, EDX, XRD and Raman examinations were utilized for systematic characterization of α-TeO2 CMS. In addition to experimental physical and structural studies on α-TeO2 CMSs, gamma-ray attenuation properties were also determined and compared with Quartz and some novel glasses such as PNCKM5, C25, SCNZ7 along with some commercial glasses such as RS253, RS253G18, RS323G19, RS360, RS520 using FLUKA general-purpose Monte Carlo code. EDX results indicated that only Te and O elements were available in the α-TeO2 CMS. The finding showed that gamma-ray attenuation competencies of α-TeO2 CMS is higher than many novel and commercial glasses in addition to traditional concrete shields. It can be concluded that further comparison studies can be done between normal glass structure and α-TeO2 CMS (or similar) occurred glass structures in terms of better understanding the total gamma-ray attenuation and the effect of α-TeO2 CMS. © 2021 The Author(s).
Keywords: CRYSTALLINE MICROSTRUCTURES
EDX
FLUKA
RAMAN
SM2O3 GLASSES
XRD
ELECTROMAGNETIC WAVE ATTENUATION
GAMMA RAYS
GLASS
MICROSTRUCTURE
SAMARIUM COMPOUNDS
TELLURIUM COMPOUNDS
VANADIUM PENTOXIDE
ATTENUATION PROPERTIES
COMMERCIAL GLASS
CRYSTALLINE MICROSTRUCTURE
FLUKA
GAMMA-RAY ATTENUATION
GLASS STRUCTURE
NOVEL GLASS
RAMAN
SM2O3 GLASS
XRD
X RAY DIFFRACTION
URI: http://hdl.handle.net/10995/111976
Access: info:eu-repo/semantics/openAccess
SCOPUS ID: 85121902208
PURE ID: 29211029
ISSN: 2238-7854
metadata.dc.description.sponsorship: The authors thank Taif University Researchers Supporting Project number (TURSP-2020/12), Taif University, Taif, Saudi Arabia. The APC was covered by "Dunarea de Jos" University of Galati, Romania.
Appears in Collections:Научные публикации, проиндексированные в SCOPUS и WoS CC

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