Please use this identifier to cite or link to this item: http://elar.urfu.ru/handle/10995/111790
Title: Influence of Oxygen Ion Migration from Substrates on Photochemical Degradation of CH3NH3PbI3 Hybrid Perovskite
Authors: Zhidkov, I. S.
Akbulatov, A. F.
Inasaridze, L. N.
Kukharenko, A. I.
Frolova, L. A.
Cholakh, S. O.
Chueh, C. -C.
Troshin, P. A.
Kurmaev, E. Z.
Issue Date: 2021
Publisher: MDPI AG
MDPI AG
Citation: Influence of Oxygen Ion Migration from Substrates on Photochemical Degradation of CH3NH3PbI3 Hybrid Perovskite / I. S. Zhidkov, A. F. Akbulatov, L. N. Inasaridze et al. // Energies. — 2021. — Vol. 14. — Iss. 16. — 5062.
Abstract: Measurements of XPS survey, core levels (N 1s, O 1s, Pb 4f, I 3d), and valence band (VB) spectra of CH3NH3PbI3 (MAPbI3) hybrid perovskite prepared on different substrates (glass, indium tin oxide (ITO), and TiO2) aged under different light-soaking conditions at room temperature are presented. The results reveal that the photochemical stability of MAPbI3 depends on the type of substrate and gradually decreases when glass is replaced by ITO and TiO2. Also, the degradation upon exposure to visible light is accompanied by the formation of MAI, PbI2, and Pb0 products as shown by XPS core levels spectra. According to XPS O 1s and VB spectra measurements, this degradation process is superimposed on the partial oxidation of lead atoms in ITO/MAPbI3 and TiO2/MAPbI3, for which Pb–O bonds are formed due to the diffusion of the oxygen ions from the substrates. This unexpected interaction leads to additional photochemical degradation. © 2021 by the author. Licensee MDPI, Basel, Switzerland.
Keywords: HYBRID PEROVSKITES
LIGHT-INDUCED DEGRADATION
OXYGEN IONS
SUBSTRATES
XPS
CORE LEVELS
INDIUM COMPOUNDS
ITO GLASS
LAYERED SEMICONDUCTORS
LIGHT
OXYGEN
PEROVSKITE
PHOTODEGRADATION
SUBSTRATES
TIN OXIDES
TITANIUM DIOXIDE
X RAY PHOTOELECTRON SPECTROSCOPY
DEGRADATION PROCESS
DIFFERENT SUBSTRATES
INFLUENCE OF OXYGEN
PARTIAL OXIDATIONS
PHOTOCHEMICAL DEGRADATION
PHOTOCHEMICAL STABILITY
SPECTRA MEASUREMENTS
VALENCE BAND SPECTRA
LEAD COMPOUNDS
URI: http://elar.urfu.ru/handle/10995/111790
Access: info:eu-repo/semantics/openAccess
RSCI ID: 47017868
SCOPUS ID: 85113420125
WOS ID: 000689287500001
PURE ID: 23694505
ISSN: 1996-1073
DOI: 10.3390/en14165062
metadata.dc.description.sponsorship: Funding: The sample preparation, aging experiments, UV‐vis, XRD, and SEM characterization were supported by Russian Science Foundation (project No. 19‐73‐30020). The XPS measurements were supported by the Ministry of Education and Science of the Russian Federation (project FEUZ‐2020‐0060), Theme ‘Electron’, no. AAAA‐A18‐118020190098‐5 and Russian Foundation for Basic Research (projects No. 21‐52‐52002/21 and 20‐42‐660003). C.‐C.C. acknowledges the financial support from the Ministry of Science and Technology in Taiwan (MOST 110‐2923‐E‐002‐007‐MY3) and the Top University Project from National Taiwan University (110L7836 and 110L7726).
RSCF project card: 19-73-30020
Appears in Collections:Научные публикации ученых УрФУ, проиндексированные в SCOPUS и WoS CC

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