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Поле DC | Значение | Язык |
---|---|---|
dc.contributor.author | Vokhmintsev, A. | en |
dc.contributor.author | Petrenyov, I. | en |
dc.contributor.author | Kamalov, R. | en |
dc.contributor.author | Weinstein, I. | en |
dc.date.accessioned | 2022-05-12T08:17:28Z | - |
dc.date.available | 2022-05-12T08:17:28Z | - |
dc.date.issued | 2022 | - |
dc.identifier.citation | Quantum Conductors Formation and Resistive Switching Memory Effects in Zirconia Nanotubes / A. Vokhmintsev, I. Petrenyov, R. Kamalov et al. // Nanotechnology. — 2022. — Vol. 33. — Iss. 7. — 075208. | en |
dc.identifier.issn | 0957-4484 | - |
dc.identifier.other | All Open Access, Green | 3 |
dc.identifier.uri | http://elar.urfu.ru/handle/10995/111396 | - |
dc.description.abstract | The prospects of the development of non-volatile memory elements that involve memristive metal-dielectric-metal sandwich structures are due to the possibility of reliably implementing sustained functional states with quantized conductance. In the present paper, we have explored the properties of Zr/ZrO2/Au memristors fabricated based on an anodic zirconia layer that consists of an ordered array of vertically oriented non-stoichiometric nanotubes with an outer diameter of 30 nm. The operational stability of the designed memory devices has been analyzed in unipolar and bipolar resistive switching modes. The resistance ratio ≥105 between high-resistance (HRS) and low-resistance (LRS) states has been evaluated. It has been found that the LRS conductivity is quantized over a wide range with a fundamental minimum of 0.5G 0 = 38.74 μS due to the formation of quantum conductors based on oxygen vacancies (VO). For Zr/ZrO2/Au memristors, resistive switching mechanisms to be sensitive to the migration of VO in an applied electric field have been proposed. It has been shown that the ohmic type and space-charge-limited conductivities are realized in the LRS and HRS, respectively. Besides, we have offered a brief review of parameters for functional metal/zirconia/metal nanolayered structures to create effective memristors with multiple resistive states and a high resistance ratio. © 2021 IOP Publishing Ltd. | en |
dc.format.mimetype | application/pdf | en |
dc.language.iso | en | en |
dc.publisher | IOP Publishing Ltd | en1 |
dc.publisher | IOP Publishing | en |
dc.rights | info:eu-repo/semantics/openAccess | en |
dc.source | Nanotechnology | 2 |
dc.source | Nanotechnology | en |
dc.subject | MEMRISTOR | en |
dc.subject | OXYGEN VACANCIES | en |
dc.subject | QUANTUM CONDUCTIVE FILAMENTS | en |
dc.subject | RESISTANCE STATE | en |
dc.subject | ZRO2 | en |
dc.subject | DIGITAL STORAGE | en |
dc.subject | ELECTRIC FIELDS | en |
dc.subject | GOLD COMPOUNDS | en |
dc.subject | MEMRISTORS | en |
dc.subject | NANOTUBES | en |
dc.subject | QUANTUM THEORY | en |
dc.subject | ZIRCONIA | en |
dc.subject | CONDUCTIVE FILAMENTS | en |
dc.subject | HIGH RESISTANCE | en |
dc.subject | LOW RESISTANCE | en |
dc.subject | MEMORY EFFECTS | en |
dc.subject | MEMRISTOR | en |
dc.subject | QUANTUM CONDUCTIVE FILAMENT | en |
dc.subject | RESISTANCE RATIO | en |
dc.subject | RESISTANCE STATE | en |
dc.subject | RESISTIVE SWITCHING MEMORY | en |
dc.subject | ZIRCONIA NANOTUBES | en |
dc.subject | OXYGEN VACANCIES | en |
dc.title | Quantum Conductors Formation and Resistive Switching Memory Effects in Zirconia Nanotubes | en |
dc.type | Article | en |
dc.type | info:eu-repo/semantics/article | en |
dc.type | info:eu-repo/semantics/submittedVersion | en |
dc.identifier.rsi | 47546094 | - |
dc.identifier.doi | 10.1088/1361-6528/ac2e22 | - |
dc.identifier.scopus | 85121784261 | - |
local.contributor.employee | Vokhmintsev, A., NANOTECH Centre, Ural Federal University, Ekaterinburg, 620002, Russian Federation; Petrenyov, I., NANOTECH Centre, Ural Federal University, Ekaterinburg, 620002, Russian Federation; Kamalov, R., NANOTECH Centre, Ural Federal University, Ekaterinburg, 620002, Russian Federation; Weinstein, I., NANOTECH Centre, Ural Federal University, Ekaterinburg, 620002, Russian Federation, Institute of Metallurgy, Ural Branch, Russian Academy of Sciences, Ekaterinburg, Russian Federation | en |
local.issue | 7 | - |
local.volume | 33 | - |
dc.identifier.wos | 000723405100001 | - |
local.contributor.department | NANOTECH Centre, Ural Federal University, Ekaterinburg, 620002, Russian Federation; Institute of Metallurgy, Ural Branch, Russian Academy of Sciences, Ekaterinburg, Russian Federation | en |
local.identifier.pure | 29073197 | - |
local.description.order | 075208 | - |
local.identifier.eid | 2-s2.0-85121784261 | - |
local.identifier.wos | WOS:000723405100001 | - |
local.identifier.pmid | 34624881 | - |
Располагается в коллекциях: | Научные публикации ученых УрФУ, проиндексированные в SCOPUS и WoS CC |
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2-s2.0-85121784261.pdf | 1,08 MB | Adobe PDF | Просмотреть/Открыть |
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