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dc.contributor.authorVokhmintsev, A.en
dc.contributor.authorPetrenyov, I.en
dc.contributor.authorKamalov, R.en
dc.contributor.authorWeinstein, I.en
dc.date.accessioned2022-05-12T08:17:28Z-
dc.date.available2022-05-12T08:17:28Z-
dc.date.issued2022-
dc.identifier.citationQuantum Conductors Formation and Resistive Switching Memory Effects in Zirconia Nanotubes / A. Vokhmintsev, I. Petrenyov, R. Kamalov et al. // Nanotechnology. — 2022. — Vol. 33. — Iss. 7. — 075208.en
dc.identifier.issn0957-4484-
dc.identifier.otherAll Open Access, Green3
dc.identifier.urihttp://elar.urfu.ru/handle/10995/111396-
dc.description.abstractThe prospects of the development of non-volatile memory elements that involve memristive metal-dielectric-metal sandwich structures are due to the possibility of reliably implementing sustained functional states with quantized conductance. In the present paper, we have explored the properties of Zr/ZrO2/Au memristors fabricated based on an anodic zirconia layer that consists of an ordered array of vertically oriented non-stoichiometric nanotubes with an outer diameter of 30 nm. The operational stability of the designed memory devices has been analyzed in unipolar and bipolar resistive switching modes. The resistance ratio ≥105 between high-resistance (HRS) and low-resistance (LRS) states has been evaluated. It has been found that the LRS conductivity is quantized over a wide range with a fundamental minimum of 0.5G 0 = 38.74 μS due to the formation of quantum conductors based on oxygen vacancies (VO). For Zr/ZrO2/Au memristors, resistive switching mechanisms to be sensitive to the migration of VO in an applied electric field have been proposed. It has been shown that the ohmic type and space-charge-limited conductivities are realized in the LRS and HRS, respectively. Besides, we have offered a brief review of parameters for functional metal/zirconia/metal nanolayered structures to create effective memristors with multiple resistive states and a high resistance ratio. © 2021 IOP Publishing Ltd.en
dc.format.mimetypeapplication/pdfen
dc.language.isoenen
dc.publisherIOP Publishing Ltden1
dc.publisherIOP Publishingen
dc.rightsinfo:eu-repo/semantics/openAccessen
dc.sourceNanotechnology2
dc.sourceNanotechnologyen
dc.subjectMEMRISTORen
dc.subjectOXYGEN VACANCIESen
dc.subjectQUANTUM CONDUCTIVE FILAMENTSen
dc.subjectRESISTANCE STATEen
dc.subjectZRO2en
dc.subjectDIGITAL STORAGEen
dc.subjectELECTRIC FIELDSen
dc.subjectGOLD COMPOUNDSen
dc.subjectMEMRISTORSen
dc.subjectNANOTUBESen
dc.subjectQUANTUM THEORYen
dc.subjectZIRCONIAen
dc.subjectCONDUCTIVE FILAMENTSen
dc.subjectHIGH RESISTANCEen
dc.subjectLOW RESISTANCEen
dc.subjectMEMORY EFFECTSen
dc.subjectMEMRISTORen
dc.subjectQUANTUM CONDUCTIVE FILAMENTen
dc.subjectRESISTANCE RATIOen
dc.subjectRESISTANCE STATEen
dc.subjectRESISTIVE SWITCHING MEMORYen
dc.subjectZIRCONIA NANOTUBESen
dc.subjectOXYGEN VACANCIESen
dc.titleQuantum Conductors Formation and Resistive Switching Memory Effects in Zirconia Nanotubesen
dc.typeArticleen
dc.typeinfo:eu-repo/semantics/articleen
dc.typeinfo:eu-repo/semantics/submittedVersionen
dc.identifier.rsi47546094-
dc.identifier.doi10.1088/1361-6528/ac2e22-
dc.identifier.scopus85121784261-
local.contributor.employeeVokhmintsev, A., NANOTECH Centre, Ural Federal University, Ekaterinburg, 620002, Russian Federation; Petrenyov, I., NANOTECH Centre, Ural Federal University, Ekaterinburg, 620002, Russian Federation; Kamalov, R., NANOTECH Centre, Ural Federal University, Ekaterinburg, 620002, Russian Federation; Weinstein, I., NANOTECH Centre, Ural Federal University, Ekaterinburg, 620002, Russian Federation, Institute of Metallurgy, Ural Branch, Russian Academy of Sciences, Ekaterinburg, Russian Federationen
local.issue7-
local.volume33-
dc.identifier.wos000723405100001-
local.contributor.departmentNANOTECH Centre, Ural Federal University, Ekaterinburg, 620002, Russian Federation; Institute of Metallurgy, Ural Branch, Russian Academy of Sciences, Ekaterinburg, Russian Federationen
local.identifier.pure29073197-
local.description.order075208-
local.identifier.eid2-s2.0-85121784261-
local.identifier.wosWOS:000723405100001-
local.identifier.pmid34624881-
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