Please use this identifier to cite or link to this item: http://hdl.handle.net/10995/102289
Title: The electronic structure formation of CuxTiSe2 in a wide range (0.04 < x < 0.8) of copper concentration
Authors: Shkvarin, A. S.
Yarmoshenko, Y. M.
Yablonskikh, M. V.
Merentsov, A. I.
Shkvarina, E. G.
Titov, A. A.
Zhukov, Y. M.
Titov, A. N.
Issue Date: 2016
Publisher: American Institute of Physics Inc.
Citation: The electronic structure formation of CuxTiSe2 in a wide range (0.04 < x < 0.8) of copper concentration / A. S. Shkvarin, Y. M. Yarmoshenko, M. V. Yablonskikh, et al. — DOI 10.1063/1.4941767 // Journal of Chemical Physics. — 2016. — Vol. 144. — Iss. 7. — 074702.
Abstract: An experimental study of the electronic structure of copper intercalated titanium dichalcogenides in a wide range of copper concentrations (x = 0.04-0.8) using X-ray photoelectron spectroscopy, resonant photoelectron spectroscopy, and X-ray absorption spectroscopy has been performed. Shift towards low energies of the Ti 2p and Se 3d core level spectra and a corresponding decrease in the photon energy of Ti 2p absorption spectra with the increase in copper concentration have been found. These sign-anomalous shifts may be explained by the shielding effect of the corresponding atomic shells as a result of the dynamic charge transfer during the formation of a covalent chemical bond between the copper atoms and the TiSe2 matrix. © 2016 AIP Publishing LLC.
Keywords: CHARGE TRANSFER
COPPER
ELECTRONIC STRUCTURE
PHOTOELECTRONS
PHOTONS
X RAY ABSORPTION SPECTROSCOPY
ATOMIC SHELL
COPPER ATOMS
COPPER CONCENTRATION
CORE-LEVEL SPECTRA
DICHALCOGENIDES
PHOTON ENERGY
SHIELDING EFFECT
X RAY PHOTOELECTRON SPECTROSCOPY
URI: http://hdl.handle.net/10995/102289
Access: info:eu-repo/semantics/openAccess
SCOPUS ID: 84959010876
PURE ID: 701512
0785431f-bec0-4b7b-81ca-7151406fb5d7
ISSN: 219606
DOI: 10.1063/1.4941767
Appears in Collections:Научные публикации, проиндексированные в SCOPUS и WoS CC

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