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dc.contributor.authorAlikin, D. O.en
dc.contributor.authorIevlev, A. V.en
dc.contributor.authorLuchkin, S. Y.en
dc.contributor.authorTurygin, A. P.en
dc.contributor.authorShur, V. Y.en
dc.contributor.authorKalinin, S. V.en
dc.contributor.authorKholkin, A. L.en
dc.contributor.authorШур, В. Я.ru
dc.date.accessioned2021-08-31T15:02:55Z-
dc.date.available2021-08-31T15:02:55Z-
dc.date.issued2016-
dc.identifier.citationCharacterization of LiMn2O4 cathodes by electrochemical strain microscopy / D. O. Alikin, A. V. Ievlev, S. Y. Luchkin, et al. — DOI 10.1063/1.4943944 // Applied Physics Letters. — 2016. — Vol. 108. — Iss. 11. — 113106.en
dc.identifier.issn36951-
dc.identifier.otherFinal2
dc.identifier.otherAll Open Access, Green3
dc.identifier.otherhttps://www.scopus.com/inward/record.uri?eid=2-s2.0-84961736637&doi=10.1063%2f1.4943944&partnerID=40&md5=9d0b4c030b4c9a5d43a40bf7684f0bf9
dc.identifier.otherhttps://ria.ua.pt/bitstream/10773/18204/1/Characterization%20of%20LiMn2O4%20cathodes%20by%20electrochemical%20strain%20microscopy_10.10631.4943944.pdfm
dc.identifier.urihttp://elar.urfu.ru/handle/10995/102272-
dc.description.abstractElectrochemical strain microscopy (ESM) is a scanning probe microscopy (SPM) method in which the local electrodiffusion is probed via application of AC voltage to the SPM tip and registration of resulting electrochemical strain. Here, we implemented ESM to measure local strain in bulk LiMn2O4 cathodes of a commercial Li-battery in different states of charge to investigate distribution of Li-ion mobility and concentration. Ramped AC ESM imaging and voltage spectroscopy were used to find the most reliable regime of measurements allowing separating and diminishing different contributions to ESM. This is not a trivial task due to complex geometry of the sample and various obstacles resulting in less predictable contributions of different origins into ESM response: Electrostatic tip-surface interactions, charge injection, electrostriction, and flexoelectricity. Understanding and control of these contributions is an important step towards quantitative interpretation of ESM data. © 2016 AIP Publishing LLC.en
dc.format.mimetypeapplication/pdfen
dc.language.isoenen
dc.publisherAmerican Institute of Physics Inc.en
dc.rightsinfo:eu-repo/semantics/openAccessen
dc.sourceAppl Phys Lett2
dc.sourceApplied Physics Lettersen
dc.subjectELECTRODESen
dc.subjectLITHIUM-ION BATTERIESen
dc.subjectSCANNING PROBE MICROSCOPYen
dc.subjectCOMPLEX GEOMETRIESen
dc.subjectDIFFERENT ORIGINSen
dc.subjectELECTROCHEMICAL STRAINen
dc.subjectELECTROCHEMICAL STRAIN MICROSCOPIESen
dc.subjectELECTRODIFFUSIONen
dc.subjectQUANTITATIVE INTERPRETATIONen
dc.subjectSTATES OF CHARGESen
dc.subjectTIP-SURFACE INTERACTIONen
dc.subjectCATHODESen
dc.titleCharacterization of LiMn2O4 cathodes by electrochemical strain microscopyen
dc.typeArticleen
dc.typeinfo:eu-repo/semantics/articleen
dc.typeinfo:eu-repo/semantics/publishedVersionen
dc.identifier.doi10.1063/1.4943944-
dc.identifier.scopus84961736637-
local.contributor.employeeAlikin, D.O., Institute of Natural Sciences, Ural Federal University, 51 Lenin Ave., Ekaterinburg, 620000, Russian Federation
local.contributor.employeeIevlev, A.V., Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, United States, Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831, United States
local.contributor.employeeLuchkin, S.Y., Physics Department and CICECO-Aveiro Institute of Materials, University of Aveiro, Aveiro, 3810-193, Portugal
local.contributor.employeeTurygin, A.P., Institute of Natural Sciences, Ural Federal University, 51 Lenin Ave., Ekaterinburg, 620000, Russian Federation
local.contributor.employeeShur, V.Y., Institute of Natural Sciences, Ural Federal University, 51 Lenin Ave., Ekaterinburg, 620000, Russian Federation
local.contributor.employeeKalinin, S.V., Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, United States, Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831, United States
local.contributor.employeeKholkin, A.L., Institute of Natural Sciences, Ural Federal University, 51 Lenin Ave., Ekaterinburg, 620000, Russian Federation, Physics Department and CICECO-Aveiro Institute of Materials, University of Aveiro, Aveiro, 3810-193, Portugal
local.issue11-
local.volume108-
local.contributor.departmentInstitute of Natural Sciences, Ural Federal University, 51 Lenin Ave., Ekaterinburg, 620000, Russian Federation
local.contributor.departmentCenter for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, United States
local.contributor.departmentInstitute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831, United States
local.contributor.departmentPhysics Department and CICECO-Aveiro Institute of Materials, University of Aveiro, Aveiro, 3810-193, Portugal
local.identifier.pure737244-
local.identifier.puref5123336-2fe4-46fc-bb7a-14bea48358cduuid
local.description.order113106-
local.identifier.eid2-s2.0-84961736637-
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