Please use this identifier to cite or link to this item: http://hdl.handle.net/10995/102223
Title: Thickness effect on the structure, grain size, and local piezoresponse of self-polarized lead lanthanum zirconate titanate thin films
Authors: Melo, M.
Araújo, E. B.
Shvartsman, V. V.
Shur, V. Y.
Kholkin, A. L.
Шур, В. Я.
Issue Date: 2016
Publisher: American Institute of Physics Inc.
Citation: Thickness effect on the structure, grain size, and local piezoresponse of self-polarized lead lanthanum zirconate titanate thin films / M. Melo, E. B. Araújo, V. V. Shvartsman, et al. — DOI 10.1063/1.4960137 // Journal of Applied Physics. — 2016. — Vol. 120. — Iss. 5. — 054101.
Abstract: Polycrystalline lanthanum lead zirconate titanate (PLZT) thin films were deposited on Pt/TiO2/SiO2/Si substrates to study the effects of the thickness and grain size on their structural and piezoresponse properties at nanoscale. Thinner PLZT films show a slight (100)-orientation tendency that tends to random orientation for the thicker film, while microstrain and crystallite size increases almost linearly with increasing thickness. Piezoresponse force microscopy and autocorrelation function technique were used to demonstrate the existence of local self-polarization effect and to study the thickness dependence of correlation length. The obtained results ruled out the bulk mechanisms and suggest that Schottky barriers near the film-substrate are likely responsible for a build-in electric field in the films. Larger correlation length evidence that this build-in field increases the number of coexisting polarization directions in larger grains leading to an alignment of macrodomains in thinner films. © 2016 Author(s).
Keywords: AUTOCORRELATION
CRYSTALLITE SIZE
ELECTRIC FIELDS
FERROELECTRIC CERAMICS
GRAIN SIZE AND SHAPE
LANTHANUM
POLARIZATION
SCANNING PROBE MICROSCOPY
SCHOTTKY BARRIER DIODES
SEMICONDUCTING LEAD COMPOUNDS
SUBSTRATES
TITANIUM COMPOUNDS
AUTOCORRELATION FUNCTIONS
CORRELATION LENGTHS
LANTHANUM LEAD ZIRCONATE TITANATES
LEAD LANTHANUM ZIRCONATE TITANATE THIN FILM
PIEZORESPONSE FORCE MICROSCOPY
POLARIZATION DIRECTION
RANDOM ORIENTATIONS
THICKNESS DEPENDENCE
THIN FILMS
URI: http://hdl.handle.net/10995/102223
Access: info:eu-repo/semantics/openAccess
SCOPUS ID: 84982740449
PURE ID: 1054619
1fe55918-3b98-40c3-8bf7-1840a0d7abc2
ISSN: 218979
DOI: 10.1063/1.4960137
Appears in Collections:Научные публикации, проиндексированные в SCOPUS и WoS CC

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