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Название: Thickness effect on the structure, grain size, and local piezoresponse of self-polarized lead lanthanum zirconate titanate thin films
Авторы: Melo, M.
Araújo, E. B.
Shvartsman, V. V.
Shur, V. Y.
Kholkin, A. L.
Шур, В. Я.
Дата публикации: 2016
Издатель: American Institute of Physics Inc.
Библиографическое описание: Thickness effect on the structure, grain size, and local piezoresponse of self-polarized lead lanthanum zirconate titanate thin films / M. Melo, E. B. Araújo, V. V. Shvartsman, et al. — DOI 10.1063/1.4960137 // Journal of Applied Physics. — 2016. — Vol. 120. — Iss. 5. — 054101.
Аннотация: Polycrystalline lanthanum lead zirconate titanate (PLZT) thin films were deposited on Pt/TiO2/SiO2/Si substrates to study the effects of the thickness and grain size on their structural and piezoresponse properties at nanoscale. Thinner PLZT films show a slight (100)-orientation tendency that tends to random orientation for the thicker film, while microstrain and crystallite size increases almost linearly with increasing thickness. Piezoresponse force microscopy and autocorrelation function technique were used to demonstrate the existence of local self-polarization effect and to study the thickness dependence of correlation length. The obtained results ruled out the bulk mechanisms and suggest that Schottky barriers near the film-substrate are likely responsible for a build-in electric field in the films. Larger correlation length evidence that this build-in field increases the number of coexisting polarization directions in larger grains leading to an alignment of macrodomains in thinner films. © 2016 Author(s).
Ключевые слова: AUTOCORRELATION
CRYSTALLITE SIZE
ELECTRIC FIELDS
FERROELECTRIC CERAMICS
GRAIN SIZE AND SHAPE
LANTHANUM
POLARIZATION
SCANNING PROBE MICROSCOPY
SCHOTTKY BARRIER DIODES
SEMICONDUCTING LEAD COMPOUNDS
SUBSTRATES
TITANIUM COMPOUNDS
AUTOCORRELATION FUNCTIONS
CORRELATION LENGTHS
LANTHANUM LEAD ZIRCONATE TITANATES
LEAD LANTHANUM ZIRCONATE TITANATE THIN FILM
PIEZORESPONSE FORCE MICROSCOPY
POLARIZATION DIRECTION
RANDOM ORIENTATIONS
THICKNESS DEPENDENCE
THIN FILMS
URI: http://elar.urfu.ru/handle/10995/102223
Условия доступа: info:eu-repo/semantics/openAccess
Идентификатор SCOPUS: 84982740449
Идентификатор WOS: 000383091600021
Идентификатор PURE: 1fe55918-3b98-40c3-8bf7-1840a0d7abc2
1054619
ISSN: 218979
DOI: 10.1063/1.4960137
Располагается в коллекциях:Научные публикации ученых УрФУ, проиндексированные в SCOPUS и WoS CC

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