Please use this identifier to cite or link to this item: http://hdl.handle.net/10995/102123
Title: Physical properties and reentrant behavior in PLZT thin films
Authors: Melo, M.
Araujo, E. B.
Neradovskaya, E. A.
Turygin, A. P.
Esin, A. A.
Shur, V. Y.
Kholkin, A. L.
Шур, В. Я.
Issue Date: 2017
Publisher: Taylor and Francis Inc.
Citation: Physical properties and reentrant behavior in PLZT thin films / M. Melo, E. B. Araujo, E. A. Neradovskaya, et al. — DOI 10.1080/00150193.2017.1289792 // Ferroelectrics. — 2017. — Vol. 509. — Iss. 1. — P. 1-9.
Abstract: La-modified lead zirconate titanate (PLZT) thin films were prepared to study their physical properties at macro- and nanoscale. Piezoresponse force microscopy (PFM) studies suggest a local imprint behavior at room temperature. Confirmed by P-E hysteresis loops recorded at 180-300 K, the imprint effect at room temperature tends to disappear at lower temperatures. In addition, the remanent polarization gradually increases and then decreases after reaching a maximum at around 243 K. This behavior suggests the occurrence of a reentrant dipole glass or an activated electric field effect in the studied PLZT films. © 2017 Taylor & Francis Group, LLC.
Keywords: DIPOLE GLASS
PLZT
RELAXORS
THIN FILMS
ELECTRIC FIELD EFFECTS
ELECTRIC FIELDS
FERROELECTRIC CERAMICS
GLASS
PHYSICAL PROPERTIES
SCANNING PROBE MICROSCOPY
SEMICONDUCTING LEAD COMPOUNDS
DIPOLE GLASS
LEAD ZIRCONATE TITANATE
LOWER TEMPERATURES
P-E HYSTERESIS LOOPS
PIEZORESPONSE FORCE MICROSCOPY
PLZT
PLZT THIN FILMS
RELAXORS
THIN FILMS
URI: http://hdl.handle.net/10995/102123
Access: info:eu-repo/semantics/openAccess
SCOPUS ID: 85019122061
PURE ID: 1814807
140b27f6-91db-4280-809b-1ab061597b77
ISSN: 150193
DOI: 10.1080/00150193.2017.1289792
Appears in Collections:Научные публикации, проиндексированные в SCOPUS и WoS CC

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