Please use this identifier to cite or link to this item: http://hdl.handle.net/10995/102103
Title: Selective sensitivity in Kerr microscopy
Authors: Soldatov, I. V.
Schäfer, R.
Issue Date: 2017
Publisher: American Institute of Physics Inc.
Citation: Soldatov I. V. Selective sensitivity in Kerr microscopy / I. V. Soldatov, R. Schäfer. — DOI 10.1063/1.4991820 // Review of Scientific Instruments. — 2017. — Vol. 88. — Iss. 7. — 073701.
Abstract: A new technique for contrast separation in wide-field magneto-optical Kerr microscopy is introduced. Utilizing the light from eight light emitting diodes, guided to the microscope by glass fibers and being switched synchronously with the camera exposure, domain images with orthogonal in-plane sensitivity can be displayed simultaneously at real-time, and images with pure in-plane or polar contrast can be obtained. The benefit of this new method of contrast separation is demonstrated for Permalloy films, a NdFeB sinter magnet, and a cobalt crystal. Moreover, the new technique is shown to strongly enhance the sensitivity of Kerr microscopy by eliminating parasitic contrast contributions occurring in conventional setups. A doubling of the in-plane domain contrast and a sensitivity to Kerr rotations as low as 0.6 mdeg is demonstrated. © 2017 Author(s).
Keywords: IRON ALLOYS
NICKEL ALLOYS
KERR MICROSCOPY
KERR ROTATION
MAGNETO-OPTICAL
PERMALLOY FILMS
REAL TIME
WIDE FIELD
LIGHT EMITTING DIODES
URI: http://hdl.handle.net/10995/102103
Access: info:eu-repo/semantics/openAccess
SCOPUS ID: 85024105632
PURE ID: 1975423
df1de898-62fd-4ede-a9e4-4fec374923eb
ISSN: 346748
DOI: 10.1063/1.4991820
Appears in Collections:Научные публикации, проиндексированные в SCOPUS и WoS CC

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