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Название: Atomic and electronic structure of a copper/graphene interface as prepared and 1.5 years after
Авторы: Boukhvalov, D. W.
Bazylewski, P. F.
Kukharenko, A. I.
Zhidkov, I. S.
Ponosov, Y. S.
Kurmaev, E. Z.
Cholakh, S. O.
Lee, Y. H.
Chang, G. S.
Дата публикации: 2017
Издатель: Elsevier B.V.
Библиографическое описание: Atomic and electronic structure of a copper/graphene interface as prepared and 1.5 years after / D. W. Boukhvalov, P. F. Bazylewski, A. I. Kukharenko, et al. — DOI 10.1016/j.apsusc.2017.07.279 // Applied Surface Science. — 2017. — Vol. 426. — P. 1167-1172.
Аннотация: We report the results of X-ray spectroscopy and Raman measurements of as-prepared graphene on a high quality copper surface and the same materials after 1.5 years under different conditions (ambient and low humidity). The obtained results were compared with density functional theory calculations of the formation energies and electronic structures of various structural defects in graphene/Cu interfaces. For evaluation of the stability of the carbon cover, we propose a two-step model. The first step is oxidation of the graphene, and the second is perforation of graphene with the removal of carbon atoms as part of the carbon dioxide molecule. Results of the modeling and experimental measurements provide evidence that graphene grown on high-quality copper substrate becomes robust and stable in time (1.5 years). However, the stability of this interface depends on the quality of the graphene and the number of native defects in the graphene and substrate. The effect of the presence of a metallic substrate with defects on the stability and electronic structure of graphene is also discussed © 2017 Elsevier B.V.
Ключевые слова: CORROSION BARRIER
DFT MODELING
GRAPHENE
OXIDATION
X-RAY SPECTROSCOPY
CARBON DIOXIDE
COPPER
DENSITY FUNCTIONAL THEORY
ELECTRONIC STRUCTURE
INTERFACES (MATERIALS)
OXIDATION
SUBSTRATES
X RAY SPECTROSCOPY
COPPER SUBSTRATES
CORROSION BARRIERS
DFT MODELING
FORMATION ENERGIES
METALLIC SUBSTRATE
RAMAN MEASUREMENTS
STRUCTURAL DEFECT
TWO-STEP MODEL
GRAPHENE
URI: http://elar.urfu.ru/handle/10995/102091
Условия доступа: info:eu-repo/semantics/openAccess
Идентификатор SCOPUS: 85026865601
Идентификатор WOS: 000413658200130
Идентификатор PURE: 513c4e67-60f4-41f8-a2f0-f43a7aad63ef
1969933
ISSN: 1694332
DOI: 10.1016/j.apsusc.2017.07.279
Располагается в коллекциях:Научные публикации ученых УрФУ, проиндексированные в SCOPUS и WoS CC

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