Please use this identifier to cite or link to this item: http://hdl.handle.net/10995/102008
Title: Depth profiles of aggregate centers and nanodefects in LiF crystals irradiated with 34 MeV 84Kr, 56 MeV 40Ar and 12 MeV 12C ions
Authors: Dauletbekova, A.
Skuratov, V.
Kirilkin, N.
Manika, I.
Maniks, J.
Zabels, R.
Akilbekov, A.
Volkov, A.
Baizhumanov, M.
Zdorovets, M.
Seitbayev, A.
Issue Date: 2018
Publisher: Elsevier B.V.
Citation: Depth profiles of aggregate centers and nanodefects in LiF crystals irradiated with 34 MeV 84Kr, 56 MeV 40Ar and 12 MeV 12C ions / A. Dauletbekova, V. Skuratov, N. Kirilkin, et al. — DOI 10.1016/j.surfcoat.2018.03.096 // Surface and Coatings Technology. — 2018. — Vol. 355. — P. 16-21.
Abstract: Depth profiles of nanohardness and photoluminescence of F2 and F3 + centers in LiF crystals irradiated with 12 MeV 12C, 56 MeV 40Ar and 34 MeV 84Kr ions at fluences 1010–1015 ions/cm2 have been studied using laser scanning confocal microscopy, dislocation etching and nanoindentation techniques. The room temperature irradiation experiments were performed at DC-60 cyclotron (Astana, Kazakhstan). It was found that the luminescence intensity profiles of aggregate color centers at low ion fluences correlate with electronic stopping profiles. The maximum intensity of aggregate center luminescence is observed at fluence around 1013 ions/cm2 and rapidly decreases with further increase of fluence. At the highest ion fluences, the luminescence signal is registered in the end-of-range area only. The depth profiles of nanohardness and chemical etching have shown remarkable ion-induced formation of dislocations and increase of hardness which in the major part of the ion range correlate with the depth profile of electronic energy loss. An exception is the end-of-range region where strong contribution of nuclear energy loss to hardening at high fluences is observed. © 2018 Elsevier B.V.
Keywords: DAMAGE DEPTH PROFILES
DISLOCATIONS
F2 AND F3 + CENTERS
HARDENING
ION IRRADIATION
LIF CRYSTALS
PHOTOLUMINESCENCE
AGGREGATES
COLOR CENTERS
DISLOCATIONS (CRYSTALS)
ENERGY DISSIPATION
ETCHING
HARDENING
ION BOMBARDMENT
IONS
LITHIUM COMPOUNDS
NANOHARDNESS
PHOTOLUMINESCENCE
ELECTRONIC ENERGY LOSS
F2 AND F3^+ CENTERS
IRRADIATION EXPERIMENTS
LASER SCANNING CONFOCAL MICROSCOPY
LIF CRYSTAL
LUMINESCENCE INTENSITY
LUMINESCENCE SIGNALS
NANOINDENTATION TECHNIQUES
FLUORINE COMPOUNDS
URI: http://hdl.handle.net/10995/102008
Access: info:eu-repo/semantics/openAccess
SCOPUS ID: 85045704553
PURE ID: 8167751
a0a0a3fb-45b9-42cf-8b79-3077b918a1de
ISSN: 2578972
DOI: 10.1016/j.surfcoat.2018.03.096
Appears in Collections:Научные публикации, проиндексированные в SCOPUS и WoS CC

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