ISSN: 2310-757X
Please use this identifier to cite or link to this item:
http://elar.urfu.ru/handle/10995/80835| Title: | Defect mechanism and electrical properties of BiFeO3 based ceramics |
| Authors: | Kim, J. C. Park, C. -M. Baek, S. B. Song, T. K. Kim, W. -J. Park, T. G. Kim, M. -H. |
| Issue Date: | 2018 |
| Publisher: | Ural Federal University |
| Citation: | Defect mechanism and electrical properties of BiFeO3 based ceramics / J. C. Kim, C. -M. Park, S. B. Baek, T. K. Song, W. -J. Kim, T. G. Park, M. -H. Kim // Scanning Probe Microscopy. Abstract Book of International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2018. — p. 135. |
| URI: | http://elar.urfu.ru/handle/10995/80835 |
| Conference name: | International Conference "Scanning Probe Microscopy" ; International Workshop "Modern Nanotechnologies" ; International Youth Conference "Functional Imaging of Nanomaterials" |
| Conference date: | 26.08.2018-29.08.2018 |
| ISBN: | 978-5-9500624-1-4 |
| Origin: | International Conference "Scanning Probe Microscopy" ; International Workshop "Modern Nanotechnologies" ; International Youth Conference "Functional Imaging of Nanomaterials". — Ekaterinburg, 2018 |
| Appears in Collections: | Scanning Probe Microscopy |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 978-5-9500624-1-4_2018_094.pdf | 10,85 kB | Adobe PDF | View/Open |
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