Please use this identifier to cite or link to this item: http://elar.urfu.ru/handle/10995/92574
Title: The influence of the interlayer on the magnetic and structural properties of three-layer systems
Authors: Shalygina, E.
Kharlamova, A.
Efremova, S.
Makarov, A.
Kurlyandskaya, G.
Svalov, A.
Issue Date: 2019
Publisher: Institute of Physics Publishing
Citation: The influence of the interlayer on the magnetic and structural properties of three-layer systems / E. Shalygina, A. Kharlamova, S. Efremova, A. Makarov, et al.. — DOI 10.1088/1742-6596/1389/1/012021 // Journal of Physics: Conference Series. — 2019. — Vol. 1. — Iss. 1389. — 12021.
Abstract: This article is dedicated to the influence analysis of the thickness and composition of nonmagnetic intermediate layers, t NM, on the magnetic and structural properties of Co/Mo/Co, Co/Si/Co, Co/Bi/Co and Fe1/PDP/Fe2 thin-film systems, as well as comparing the mechanisms of exchange interaction between ferromagnetic, FM, layers through NM spacers. The thicknesses of Co layers are equal to 5.0 nm and the thickness of Fe layers is varied from 14.0 to 50.0 nm. The thickness of NM layers, depending on its composition, is changed from 0.2 to 50.0 nm. It is found that the hysteresis loops for some samples measured in a magnetic field applied parallel to the easy magnetization axis have a rectangular form and for others - more complex two-step ones. The saturation field, HS, of Co/Mo/Co, Co/Si/Co and Co/Bi/Co samples oscillates in magnitude. These data are explained by the presence of exchange coupling between the Co layers through a NM spacer. Fe1/PDP/Fe2 samples have a two-step hysteresis loops, which at t PDP ≥ 10 nm are explained by the exchange coupling between the Fe layers through the PDP layer, and at t PDP > 10 nm - by the magnetostatic interaction between the Fe layers due to the difference in their thickness. © Published under licence by IOP Publishing Ltd.
Keywords: COBALT
EXCHANGE COUPLING
FILM THICKNESS
HYSTERESIS
HYSTERESIS LOOPS
IRON
MAGNETIC MATERIALS
MAGNETOSTATICS
MOLYBDENUM
SILICON
STRUCTURAL PROPERTIES
INFLUENCE ANALYSIS
INTERMEDIATE LAYERS
MAGNETIZATION AXIS
MAGNETOSTATIC INTERACTIONS
NONMAGNETICS
SATURATION FIELDS
THIN FILM SYSTEMS
THREE-LAYER SYSTEMS
MAGNETISM
URI: http://elar.urfu.ru/handle/10995/92574
Access: info:eu-repo/semantics/openAccess
SCOPUS ID: 85076626836
WOS ID: 000562319800021
PURE ID: 11754976
ISSN: 1742-6588
DOI: 10.1088/1742-6596/1389/1/012021
Appears in Collections:Научные публикации, проиндексированные в SCOPUS и WoS CC

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