Please use this identifier to cite or link to this item: http://hdl.handle.net/10995/83186
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dc.contributor.authorDauletbekova, A.en
dc.contributor.authorAlzhanova, A.en
dc.contributor.authorAkylbekov, A.en
dc.contributor.authorBaubekova, G.en
dc.date.accessioned2020-06-01T08:29:30Z-
dc.date.available2020-06-01T08:29:30Z-
dc.date.issued2018-
dc.identifier.citationX-ray Diffraction Investigation of Sio2/Si Track Templates with Deposited Zn / A. Dauletbekova, A. Alzhanova, A. Akylbekov, G. Baubekova // Russian Forum of Young Scientists (RFYS) (Ekaterinburg, Russia, 27–28 April , 2017). – Dubai : Knowledge E, 2018. – KnE Engineering, 3 (5). – pp. 39-45. – DOI 10.18502/keg.v3i4.2223en
dc.identifier.issn2518-6841-
dc.identifier.urihttp://hdl.handle.net/10995/83186-
dc.description.abstractSi/SiO2/Zn structures are fabricated by the track template synthesis. SEM and AFM images of the surface after electrochemical deposition of zinc were obtained. XRD analysis of the deposited samples showed the creation of zinc oxide nanocrystals with Miller indexes (200) at θ=62,30 and (201) at θ=69,50 (PDF#361451-etalon).en
dc.format.mimetypeapplication/pdfen
dc.language.isoenen
dc.publisherKnowledge Een
dc.relation.ispartofRussian Forum of Young Scientists (RFYS). — Ekaterinburg, 2018en
dc.rightsCreative Commons Attribution Licenseen
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/-
dc.titleX-ray Diffraction Investigation of Sio2/Si Track Templates with Deposited Znen
dc.typeConference Paperen
dc.typeinfo:eu-repo/semantics/conferenceObjecten
dc.typeinfo:eu-repo/semantics/publishedVersionen
dc.conference.nameRussian Forum of Young Scientists (RFYS)en
dc.conference.date27.04.2017-28.04.2017-
dc.identifier.doi10.18502/keg.v3i4.2223-
local.description.firstpage39-
local.description.lastpage45-
Appears in Collections:Междисциплинарные конференции, семинары, сборники

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