Please use this identifier to cite or link to this item: http://hdl.handle.net/10995/83186
Title: X-ray Diffraction Investigation of Sio2/Si Track Templates with Deposited Zn
Authors: Dauletbekova, A.
Alzhanova, A.
Akylbekov, A.
Baubekova, G.
Issue Date: 2018
Publisher: Knowledge E
Citation: X-ray Diffraction Investigation of Sio2/Si Track Templates with Deposited Zn / A. Dauletbekova, A. Alzhanova, A. Akylbekov, G. Baubekova // Russian Forum of Young Scientists (RFYS) (Ekaterinburg, Russia, 27–28 April , 2017). – Dubai : Knowledge E, 2018. – KnE Engineering, 3 (5). – pp. 39-45. – DOI 10.18502/keg.v3i4.2223
Abstract: Si/SiO2/Zn structures are fabricated by the track template synthesis. SEM and AFM images of the surface after electrochemical deposition of zinc were obtained. XRD analysis of the deposited samples showed the creation of zinc oxide nanocrystals with Miller indexes (200) at θ=62,30 and (201) at θ=69,50 (PDF#361451-etalon).
URI: http://hdl.handle.net/10995/83186
Access: Creative Commons Attribution License
License text: https://creativecommons.org/licenses/by/4.0/
Conference name: Russian Forum of Young Scientists (RFYS)
Conference date: 27.04.2017-28.04.2017
ISSN: 2518-6841
DOI: 10.18502/keg.v3i4.2223
Origin: Russian Forum of Young Scientists (RFYS). — Ekaterinburg, 2018
Appears in Collections:Междисциплинарные конференции, семинары, сборники

Files in This Item:
File Description SizeFormat 
10.18502_keg.v3i4.2223.pdf6,78 MBAdobe PDFView/Open


This item is licensed under a Creative Commons License Creative Commons