Please use this identifier to cite or link to this item: http://elar.urfu.ru/handle/10995/80811
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dc.contributor.authorBaraishuk, S. M.en
dc.contributor.authorTurovets, A. I.en
dc.contributor.authorTkachenko, T. М.en
dc.contributor.authorRahimov, R. N.en
dc.contributor.authorMamedov, I. Kh.en
dc.contributor.authorArrasly, D. G.en
dc.contributor.authorKhalilova, A. A.en
dc.date.accessioned2020-03-24T06:59:46Z-
dc.date.available2020-03-24T06:59:46Z-
dc.date.issued2018-
dc.identifier.citationSurface topography of the InSb-MnSb thin films / S. M. Baraishuk, A. I. Turovets, T. М. Tkachenko, R. N. Rahimov, I. Kh. Mamedov, D. G. Arrasly, A. A. Khalilova // Scanning Probe Microscopy. Abstract Book of International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2018. — p. 99-100.en
dc.identifier.isbn978-5-9500624-1-4-
dc.identifier.urihttp://elar.urfu.ru/handle/10995/80811-
dc.format.mimetypeapplication/pdfen
dc.language.isoenen
dc.publisherUral Federal Universityen
dc.relation.ispartofInternational Conference "Scanning Probe Microscopy" ; International Workshop "Modern Nanotechnologies" ; International Youth Conference "Functional Imaging of Nanomaterials". — Ekaterinburg, 2018en
dc.titleSurface topography of the InSb-MnSb thin filmsen
dc.typeConference Paperen
dc.typeinfo:eu-repo/semantics/conferenceObjecten
dc.typeinfo:eu-repo/semantics/publishedVersionen
dc.conference.nameInternational Conference "Scanning Probe Microscopy" ; International Workshop "Modern Nanotechnologies" ; International Youth Conference "Functional Imaging of Nanomaterials"en
dc.conference.date26.08.2018-29.08.2018-
local.description.firstpage99-
local.description.lastpage100-
local.description.orderP-13-
Appears in Collections:Scanning Probe Microscopy

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